Omron V440-F, Руководство пользователя

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8 Advanced Settings
V440-F C-Mount Code Reader User Manual
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6 I/O
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Symbol
Gr
ading
 Fixed Pattern Damage
Fixed Pattern Damage
is an evaluation of the elements in the fixed patterns of the symbol that are
used for locating and extracting the data successfully. Fixed Pattern Damage is calculated in accor-
dance with the ISO 15415 specification.
 Axial Non-Uniformity
Axial Non-Uniformity
measures the relationship between the overall dimensions of the two axes of
the symbol. Axial Non-Uniformity is calculated in accordance with the ISO 15415 specification.
 Grid Non-Uniformity
Grid Non-Uniformity
measures the difference of the decoding grid in relation to the ideal grid
formed from the four corners of the symbol. Grid Non-Uniformity is calculated in accordance with the
ISO 15415 specification.
 Unused Error Correction
Unused Error Correction
measures the remaining error correction available after correcting the
errors within the decoded symbol and is calculated in accordance with the ISO 15415 specification.
 Overview
This section outlines the grading implementation for ISO 29158 in the reader firmware.
 Supported Symbologies
•
Data Matrix ECC 200 / GS1 Data Matrix
 Minimum Resolution
•
6.0 Pixels Per Element = Nominal Cell Dimension
 ISO 29158 Grading Serial Output
Each grade metric can be individually enabled for serial output. These outputs can be in one of three
different formats configured by the global quality output mode parameter. The mode can be config-
ured as a letter grade A-F, the actual measured metric values 0 – 100, or as a normalized grade
value score where the grade A-F is mapped from 0-100. The enabled outputs are appended to the
symbol data with the grading separator. They are appended in their order of appearance in the
grade metric section.
 ISO 29158 Grading Logic Output and Threshold 1 - 3
Each of the three logic outputs available can be configured and driven by each of the individual
grade metrics. Each output has a corresponding configuration to enable and threshold each metric
to control assertion of the output.
 Overall Grade
The
Overall Grade
is the minimum grade of all evaluated parameters, noting minimum reflectance
is not evaluated.
 Cell Contrast
Cell Contrast
is a measure of contrast that differs from ISO 15415 using a statistical value calcu-
lated from the measurements at the grid centers. Cell Contrast is calculated in accordance with the
ISO 29158 specification.
Grading - ISO 29158
Configuration
ISO 29158 Metrics