Page 18
Functional Principle, Technical Data
scanCONTROL 29xx
3.2
Technical Data
Model
scanCONTROL
29xx-10/BL
29xx-25
29xx-50
29xx-100
Measuring range Z-axis
8 mm
25 mm
50 mm
100 mm
Start of measuring range
53 mm
53.5 mm
70 mm
190 mm
End of measuring range
61 mm
78.5 mm
120 mm
290 mm
Start of measuring range, extended, approx.
-
53 mm
65 mm
125 mm
End of measuring range, extended, approx.
-
79 mm
125 mm
390 mm
Line length midrange (X-axis)
10 mm
25 mm
50 mm
100 mm
Linearity
1
±0.17 % FSO (2
s
)
±0.10 % FSO (2
s
)
Reference resolution
2 3
1 μm
2 μm
4 μm
12 μm
Resolution X-axis
1280 points/profile
Profile frequency
2000 Hz (depending on sensor model)
Light source laser
Standard
Semiconductor laser,
approx. 405 nm (blue)
Semiconductor laser, approx. 658 nm (red)
Optional
-
Semiconductor laser, approx. 405 nm (blue)
Laser power
Standard
≤ 7 mW (laser class 2M)
≤ 8 mW (laser class 2M)
reduced 2 mW
Optional
-
≤ 20 mW (laser class 3B), reduced 8 mW
Protection class (DIN EN 60529 )
IP 65
Operating temperature
0 °C ... +45 °C (+32 ... +113 °F)
Storage temperature
-20 °C ... 70 °C (-4 ... +158 °F)
Outputs/inputs
Ethernet, Laser on/off (optional),
1x RS422 programmable (Half-duplex),
3 switching inputs programmable HTL/TTL,
all inputs and outputs galvanically isolated
Содержание 4350006.71
Страница 1: ...thicknessCONTROL MTS 8201 LLT O Frame Non contact thickness measurement Operating Instructions ...
Страница 12: ...Page 12 Laser Safety thicknessCONTROL MTS 8201 LLT 4350006 71 ...
Страница 62: ...Page 62 Instruction Manual Software thicknessCONTROL MTS 8201 LLT 4350006 71 ...
Страница 64: ...Page 64 Pneumatic Plan thicknessCONTROL MTS 8201 LLT 4350006 71 ...
Страница 70: ...Page 70 Declaration of Incorporation thicknessCONTROL MTS 8201 LLT 4350006 71 ...
Страница 95: ...Operating Instructions scanCONTROL 29xx ...
Страница 99: ...scanCONTROL 29xx Appendix A 1 Accessories 60 A 1 1 Recommended Accessories 60 A 1 2 Optional Accessories 61 ...
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Страница 135: ...Page 41 Operation of the Sensor with a PC scanCONTROL 29xx Fig 24 Predefined measuring fields ...
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