VR2250
Page 27 of 131
6.3.1. Tripping times for the general and selective RCDs
Table of tripping times for I
∆
N
x1, I
∆
N
x2, I
∆
N
x5 and AUTO tests.
If the parameters set on the instrument comply with the type of RCD under test (and
if the latter works properly) the test
x1
,
x2
,
and x5
SHALL
cause the RCD tripping
within the times shown in the following table:
RCD type
I
∆
N
x 1
I
∆
N
x 2
I
∆
N
x 5
Description
General 0.3s
0.15s
0.04s
Max
tripping time in seconds
Selective
S
0.5s 0.20s 0.15s
Max
tripping time in seconds
0.13s 0.05s 0.05s
Minimum
tripping time in seconds
* For rated values I
∆
N
≤
30mA the test current at five times is 0.25A.
For currents equal to ½
I
∆
N
the RCD shall not trip in any case.
Table 3:
Table of tripping times for tests with leakage currents I
∆
N
x1, I
∆
N
x2, I
∆
N
x5 and AUTO.
Table of tripping times for ramp tests
" "
.
This test should not be used to compare the RCD tripping time at the tripping current,
while the standards refer to the maximum tripping times in case the RCD is checked
with a leakage current equal to the rated current.
The limit values for the tripping current are indicated in the following Table:
RCD Type
I
∆
N
≤
10mA
I
∆
N
>
10mA
A
1,4 x I
∆
N
1,4 x I
∆
N
AC
I
∆
N
I
∆
N
Table 4:
Current limit value for "Ramp" Test
