HP 1660CS, Руководство пользователя

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Self-tests description
The self-tests identify the correct operation of major functional areas
in the logic analyzer. The self-tests are not intended for
component-level diagnostics.
Three types of tests are performed on the HP 1660CS-series logic
analyzers: the power-up self-tests, the functional performance
verification self-tests, and the parametric performance verification
tests.
The power-up self-tests are performed when power is applied to the
instrument. The power-up self-tests are divided into two parts. The
first part is the system memory tests and the second part is the
microprocessor interrupt test. The system memory tests are
performed before the logic analyzer actually displays the power-up
self-test screen. Both the system ROM and RAM are tested during
power-up. The interrupt test is performed after the power-up self-test
screen is displayed.
The functional performance verification self-tests are run using a
separate operating system, the performance verification (PV)
operating system. The PV operating system resides on a separate disk
that must be loaded when running the functional performance
verification self-tests. The system and analyzer tests are functional
performance verification tests.
Parametric performance verification requires the use of external test
equipment that generates and monitors test data for the logic analyzer
to read. Refer to chapter 3, "Testing Performance," of the
HP 1660C/CS-Series Logic Analyzers Service Guide
for further
information about parametric performance verification.
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