Fukuda 8000 Series, Руководство по обслуживанию

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xxvii
Safety Electromagnetic Compatibility

Compliance to the Electromagnetic Immunity (1)
The DS-8500 System is intended for use in the electromagnetic environment specified below. The customer or the
user of the DS-8500 System should assure that it is used in such an environment.
Guidance and Manufacturer's Declaration - Electromagnetic Immunity
Immunity Test
IEC 60601-1-2
Test Level
Compliance Level
Electromagnetic Environment -
Guidance
Electrostatic Discharge (ESD)
IEC 61000-4-2 ±6kV: contact
±8kV: air ±6kV: contact
±8kV: air Floors should be wood, concrete or
ceramic tile. If floors are covered with
synthetic material, the relative
humidity should be at least 30%.
Electrical fast transient/burst
IEC 61000-4-4 ±2kV: power supply lines
±1kV: input/output lines ±2kV: power supply lines
±1kV: input/output lines Mains power quality should be that of
a typical commercial or hospital
environment.
Surge
IEC 61000-4-5 ±1kV: differential mode
±2kV:common mode ±1kV: differential mode
±2kV:common mode Mains power quality should be that of
a typical commercial or hospital
environment.
Voltage dips, short interruptions
and voltage variations on power
supply input lines.
IEC 61000-4-11 <5% U
T
*
(>95% dip in U
T
)
for 0.5 cycles
<5% U
T
(>95% dip in U
T
)
for 0.5 cycles
Mains power quality should be that of
a typical commercial or hospital
environment.
If it is required to continuously
operate the DS-8500 System during
power failure, it is recommended to
operate on an uninterrupted power
supply.
40% U
T
(60% dip in U
T
)
for 5 cycles
40% U
T
(60% dip in U
T
)
for 5 cycles
70% U
T
(30% dip in U
T
)
for 25 cycles
70% U
T
(30% dip in U
T
)
for 25 cycles
<5% U
T
(>95% dip in U
T
)
for 5 sec.
<5% U
T
(>95% dip in U
T
)
for 5 sec.
Power Frequency (50/60Hz)
Magnetic Field
IEC 61000-4-8 3A/m 3A/m Power frequency magnetic fields
should be at levels characteristic of a
typical location in a typical
commercial or hospital environment.
*: U
T
is the AC mains voltage prior to application of the test level.