outdoorScan3 Core I/O
Type of output
2 PNP semiconductors for each OSSD pair, short-circuit pro‐
tected, cross-circuit monitored
Output voltage for ON state
(HIGH)
(U
V
–2.7 V) … U
V
Output voltage for OFF state
(LOW)
0 V to 2 V
Output current for ON state
(HIGH)
Leakage current
3)
≤ 250 µA
Load inductance
≤ 2.2 H
Load capacity
≤ 2.2 µF in series with 50 Ω
Switching sequence (no tog‐
gling and no simultaneous
monitoring)
Depending on the load inductance
Permissible resistivity
between load and device
≤ 2.5 Ω
Test pulse width
≤ 300 µs (typ. 230 µs)
Test pulse interval
Scan cycle time 40 ms 320 ms to 344 ms (typ. 320 ms)
Duration of OFF state
≥ 80 ms
Discrepancy time (offset
between switching from
OSSD2 and OSSD1 within an
OSSD pair)
≤ 1 ms (typ. 25 µs)
Universal output, universal I/O (configured as output)
Output voltage HIGH
(U
V
–3.7 V) … U
V
Output voltage LOW
0 V to 2 V
Output current HIGH
≤ 200 mA
Leakage current
≤ 0.5 mA
Switch-on delay
40 ms
Switch-off delay
40 ms
Static control input, universal input, universal I/O (configured as input)
Input voltage HIGH
24 V (13 V to 30 V)
Input voltage LOW
0 V (–30 V to 5 V)
Input current HIGH
3 mA to 6 mA
Input current LOW
0 mA to 2 mA
Input resistance at HIGH
Typ. 5 kΩ
Input capacity
10 nF
Input frequency (max.
switching sequence when
used as control input)
≤ 20 Hz
Sampling time
4 ms
Response time at EDM after
switching on OSSDs (when
used as EDM input)
300 ms
Actuating duration of control
switch for reset (when used
as reset input)
60 ms to 30 s
13
TECHNICAL DATA
132
O P E R A T I N G I N S T R U C T I O N S | outdoorScan3 Core I/O
8023152/160F/2019-11-14 | SICK
Subject to change without notice