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UM-B-041
SmartBond Production Line Tool
User Manual
Revision 4.8
02-Nov-2022
CFR0012
152 of 170
© 2022 Renesas Electronics
Header
Value
Description
Flash
jedec [“OQSPI”]
xxxxxx
Initialize OQSPI Flash memory. The first column shows the result of the test. The
second column shows the JEDEC ID read back from the device.
Flash
erase ‘X’ [‘Test Name’]
PASS\FAIL
Erase the OQSPI or QSPI Flash memory test.
Flash
burn ‘X’ [‘Test Name’]
PASS\FAIL
OQSPI or QSPI image write test. The first column shows the result of the test. The
second column shows the path to the firmware burnt.
Flash binary ‘X’ [‘Test Name’]
C:\path\to\bin
Memory data write
PASS\FAIL
Write any available custom memory test. The first column shows the result of the
test. The second columns shows whether the data are given from a CSV file, or the
contents written.
Memory data
“Data from CSV file” or “xx…”
OTP burn
PASS\FAIL
OTP binary write test. The first column shows the result of the test. The second
column shows the path to the firmware burnt.
OTP image
C:\path\to\bin
OTP CS burn
PASS\FAIL
OTP Configuration Script area burn.
‘SPI\OTP\EEPROM\QSPI’ Memory read ‘X’
[‘Test Name’]
PASS\FAIL
Read any part of any available memory. The first column shows the result of the
test. The second column shows the contents read back.
Memory read data
xx…
Scan
PASS\FAIL
Scan test with the DUTs booting and advertising.