HP 54620A, User'S And Service Manual

Page: 232 / 243

measuring waveform data
time between edges, 92
using cursors, 89
using dual-channel, 92
using single-channel, 91
memory
acquisition, 130
glitch detection, 130
preset configuration, 119
recalling setup from, 118
recalling trace waveform from, 115
setup, 113
trace, 112
used to capture glitch, 143–148
used to store setup, 117
memory bar, 41, 132
menu keys, 37
message line
shows measurement results, 100
shows measurements, 96, 99, 102
messages, 208
display area, 38
where displayed, 41
microprocessor system
events leading to failure, 78
setting up trigger, 78
Microsoft Windows
Benchlink software to interface logic
analyzer, 24–26
minimum detectable pattern width
concepts, 132
minimum duration trigger
concepts, 132
minimum input swing, 109
missing trigger, 71, 131
mode, 70–71
glitch, 39, 48
trigger, 39, 70–71
modify graticule, 87
Monochrome palette, 30
moving channels, 50
moving cursors simultaneously, 94–95
multimeter
use to adjust display, 162–163
use to adjust power supply, 160–161
use to check LVPS, 168
use to monitor function generator, 170
use to troubleshoot analyzer, 164
N
names
assigning to channels, 60–61
defining, 62–63
naming
channels, 40
input signals, 59
negative width measurement, 91
new labels, 62–63
no trigger, 71, 131
non-volatile settings
labels list, 63
non-volatile setup memory, 112
Normal trigger mode, 70–71, 131
numbering
of channels, 40
O
occurrence
and advanced trigger, 67
count increments on edge & pattern, 78
message, 212
operators for advanced trigger, 76
trigger, 74–79
On/Off
"Off" channels, 49
use of measurements and channels that
are off, 49
operating performance
adjusting, 159
operation of Autoscale, 45
operators
for trigger, 74–79
order of channels, 50
ordering new assemblies, 190–194
oscillator
verifying operation of, 173
oscilloscope probe
routes signal to external trigger input, 105
overview
display in advanced trigger, 74–79
of advanced trigger, 69
P
palettes
selecting colors, 31–32
pan the waveform, 80, 86
concepts of delayed sweep, 133
concepts of memory bar, 132
parameters
for trigger operator, 74–79
measured using single channel, 96–97
parameters for interface, 88
part numbers
cable, 22–23
grabbers, 22–23
ground lead, 22–23
parts
for dummy load, 158
for test connectors, 156–157
removing and ordering, 180
parts list for analyzer, 193
passive probe impedance, 139–142
Pattern, 73
irregular, repeating, 94–95
pattern duration trigger
and sample period, 48
pattern trigger, 65, 73
adding edge qualifier, 73
and edge trigger combined, 76
applications of, 66
entered, 66
qualifying with edge, 66
patterns
defining for trigger, 75
entered, 75
exited, 75
irregular, 97
satisfying trigger qualifier, 75
transitions at left of display, 97
triggering on sequence of, 77
triggering on system failure, 78
performance
verify with self-tests, 151
performance characteristics, 196
acquisition system, 199
display system, 202
EMI, 204–206
environmental, 204–206
general, 204–206
horizontal system, 198
input channels, 197
measurement functions, 202
physical, 204–206
Index
231