HP 54620A, User'S And Service Manual

Page: 226 / 243

Index
A
accessories
build for testing, 155
optional, 24–26
supplied, 22–23
accumulating results, 58
accuracy
concepts of measurement functions, 137
testing thresholds, 169
testing time intervals, 173
acquisition
and channels that are off, 49
and trigger, 65
and trigger mode, 70–71
buffer, 46
concepts of glitch detection, 143–148
indicator for, 39
overhead affects trigger output rate, 107
process of, 55
setting up with Autoscale, 44–45
single, 56
starting, 46
stop to increase trigger out rate, 107, 110
stopping, 46
time reference example, 134
acquisition behavior
repetitive run, 131
single shot, 131
acquisition concepts, 129–138
acquisition memory, 129–138
amount displayed, 41
and trigger event, 70
displayed by memory bar, 132
location of trigger event, 83–85
setting time reference in, 83–85
size relative to sweep speeds, 130
time reference concepts, 133
timebase affects time to fill, 138
trigger event position, 130
acquisition results
save in trace memory, 113
acquisition system
performance characteristics, 199
self-tests, 154
test, 151
action keys, 37
action to cause trigger, 71, 132
activity check during Autoscale, 45
activity indicators
for threshold test, 172
adjusting
delay, 93
display brightness, 29
handle, 28
sweep, 93
adjusting the analyzer, 150, 159
display, 162–163
display pattern, 163
vertical hold, 162–163
voltage tolerance, 160–161
adjustments
display, 162–163
high frequency, 159
low frequency, 159
power supply, 160–161
Adv, 69, 74–79
advanced trigger, 65, 74–79
applications of, 67
overview display, 69
satisfying events to trigger analyzer, 79
setting up, 76
setup rules, 76
solve data acquisition problems, 76
aliasing, 144
produces misleading information, 56
Alternate color palettes, 30
analyzer
acquisition memory concepts, 130
adjusting for performance, 159
built-in tests, 151
calculates delay time, 99
calculates duty cycle, 97
calculates hold time, 102
calculates input frequency, 96
calculates input period, 97
calculates setup time, 100
calculates widths, 97
checking LVPS, 165–168
circuit probing concepts, 139–142
concepts for making measurements, 128
concepts of glitch detection, 143–148
configuration preset, 119
connect to test threshold accuracy, 171
connect to test time interval, 174
delayed sweep concepts, 133
disassembling, 181
displaying glitch, 146
does not display ringing, 141
enables glitch capture, 143–148
fan running?, 167
See logic analyzer
measurement function concepts, 137
measurement process, 92
messages, 208
performance characteristics, 196
preset configuration, 119
relationships with timebase, 129–138
removing cover to adjust, 160–161
removing covers to service, 164
removing power supply, 187
removing system board, 186
removing the cabinet, 182
removing the display, 185
removing the fan, 183
removing the front panel, 184
removing the handle, 189
removing the keyboard, 188
replaceable parts, 180
resetting, 123
saves current trace waveform, 114
saves instrument setup, 114
setup to test time interval accuracy, 176
stores setup, 117
sweep speed and sampling intervals, 130
test accessories, 155
test channel thresholds, 172
testing and troubleshooting, 150
time reference concepts, 133
timebase concepts, 137
trigger function concepts, 132
trigger mode concepts, 131
triggers when events satisfied, 79
troubleshooting, 164–167
view of parts, 192
warm up before adjusting, 159
analyzer controls, 35–36
applications of cursor settings, 95
applications of trigger
to complex situations, 67
to edges, 65
to patterns, 66
apply squarewave signal to external trigger
input, 109
assemblies
225