110
Chapter 4
Making Measurements
Making the Adjacent Channel Power (ACP) Measurement
Make sure the
ACP
measurement is selected under the
Measure
menu.
The
Meas Setup
key accesses the menu which allows you to modify the
average number and average mode for this measurement. In addition,
the following parameters for adjacent channel power measurements
can be modified.
•
Ref Channel
- Allows you to access the following parameters for the
reference channel settings:
Chan Integ BW
- Allows you to specify the channel integration
bandwidth in which the carrier power is measured. The range is
1.000 kHz to 20.0000 MHz with the best resolution of 1 Hz.
Avg Type
- Choose the averaging type between
Pwr Avg (RMS)
and
Maximum
.
Ref Chan Adv
- Allows you to access the menu to change the
following advanced parameters for the reference channel:
Sweep Time
Data Points
- Allows you to select the number of data points.
The automatic mode chooses the optimum number of points for
the fastest measurement time with acceptable repeatability.
The minimum number of points that could be used is
determined by the sweep time and the sampling rate. You can
increase the length of the measured time record (capture more
of the burst) by increasing the number of points, but the
measurement will take longer.
Res BW
- informational only
Num FFT Seg
- Allows you to select the number of FFT
segments used in making the measurement of the reference
channel (carrier). In automatic mode the measurement
optimizes the number of FFT segments required for the
shortest measurement time. The minimum number of
segments required to make a measurement is set by your
desired measurement bandwidth. Selecting more than the
minimum number of segments will give you more dynamic
range for making the measurement, but the measurement will
take longer to execute.
•
Offset/Limits
- Allows you to access the menu to change the following
parameters for offset frequency settings and pass/fail tests:
Offset - Allows you to select one of five offsets (
A
through
E
). Only
one selection at a time (A, B, C, D, or E) is shown on this key
label. The remaining softkeys on the
Offset/Limits
menu then
apply to the selected offset.
Summary of Contents for E4406A
Page 4: ...4 ...
Page 10: ...10 Contents ...
Page 138: ...138 Chapter4 Making Measurements Front Panel Test ...
Page 139: ...139 5 Functional Testing ...
Page 214: ...214 Chapter6 If You Have a Problem Returning Your Instrument to Agilent Technologies ...
Page 216: ...216 Chapter6 If You Have a Problem Repair Tag Goes Here Remove This Page ...
Page 217: ...217 7 Options and Accessories ...
Page 226: ...226 Chapter7 Options and Accessories Accessories ...