Agilent Technologies 16900 Series, Service Manual

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Chapter 3: Testing Logic Analyzer Performance
Test Pod 2 in 500 Mb/s Mode
Yes
to erase the data and continue.
25 Perform the procedure “Determine PASS/FAIL (1 of 2 tests)” on page 47.
26 Select the Run Repetitive icon .
27 Perform the procedure “Determine PASS/FAIL (2 of 2 tests)” on page 49.
Test the complement of the bits (Pod 1, 500 Mb/s mode)
Now test the logic analyzer using complement data.
1 On the 8133A pulse generator, in the PULSE setup for CHANNEL 2, select
COMP.
2 Note that the signal on the oscilloscope has moved. Change the
oscilloscope’s horizontal position to -725 ps (or as required) to center the
measured pulse on the oscilloscope display.
3 Verify the DC offset and adjust it if necessary. See page 36.
4 Deskew the oscilloscope if necessary. See page 37.
5 Verify that the pulse width is set to 1.5 ns. See page 39.
6 Run Eye Finder and align stray channels if necessary.
7 Perform the procedure “Determine PASS/FAIL (1 of 2 tests)” on page 47.
8 Select the Run Repetitive icon .
9 Perform the procedure “Determine PASS/FAIL (2 of 2 tests)” on page 49
Test Pod 2 in 500 Mb/s Mode
1 Leave the first E5383A Flying Lead Probe Set connected to Pod 1 of the
logic analyzer. Remove the Pod 1 flying leads 2, 6, 10, and 14 from the
SMA/Flying Lead test connectors. Do not remove the flying leads that are
connected to CLK and CLK flying leads.
2 Connect the second E5383A Flying Lead Probe Set to Pod 2.
3 Connect the Pod 2 E5383A Flying Lead Probe Set’s bits 6 and 14 to the