Agilent Technologies 16900 Series, Service Manual

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Chapter 3: Testing Logic Analyzer Performance
Test Pod 1 in 500 Mb/s Mode
See page 46.
18 Now set the pulse generator to the new test frequency. The logic analyzer
will be tested using a double-edge clock. The test frequency is half the test
clock rate because data is acquired on both the rising edge and the falling
edge of the clock. Set the frequency to 250 MHz plus the frequency
uncertainty of the pulse generator, plus a test margin of 1%.
For example, if you are using an 8133A pulse generator, the frequency
accuracy is ±1% of setting. Use a test margin of 1%. Set the frequency to
250 MHz plus 2% (255 MHz).
19 The pulse measured on the oscilloscope may have moved slightly. Verify
the DC offset and adjust it if necessary. See page 36.
20 Verify the oscilloscope Deskew and adjust if necessary. See page 37.
21 Adjust the measured pulse width from the pulse generator to 1.5 ns
(minus the test margin) as described on page 39.
22 Open the Eye Finder window, and align the blue bars vertically. See page
44.
23 Grab the blue bar for “My Bus 1” and move it to the recommended starting
position you noted on page 55.
24 Run Eye Finder again. Some eyes may close, but the eyes in the sampling
position you chose on page 55 should remain open.
When you close the Analyzer Setup window a dialog may appear. If so, answer