Tektronix 434, Инструкция по эксплуатации

Страница: 29 / 222

O perating In s tru c tio n s —4 3 4
f
C A U T I O N <
i <,
y - T ' S ' ^ y "
D o n o t a tte m p t to store e x tre m e ly fast-rising o r fast-
fa llin g p o rtio n s o f w a ve fo rm s view ed a t re la tiv e ly
s lo w sweep rates. The high trace in te n s ity re q u ire d
(due to th e in te n s ity d iffe re n c e betw een the h o riz o n ­
ta l a n d the v e rtic a l segments) c o u ld cause storage
target damage.
Fast Single-Sweep Enhancem ent
The Enhance m ode provides a m e th o d o f storing single­
sweep displays th a t exceed the norm al w ritin g speed o f th e
in s tru m e n t. T h is m ode is n o t n o rm a lly used fo r re p e titiv e
sweeps.
1. A p p ly a 30 kH z (350 k H z fo r O p tio n 1 C R T)
sine-wave signal -for a C R T d isp la y o f a p p ro x im a te ly 3.2
d ivisio n s P-P a m p litu d e to one o f th e ve rtica l in p u t
connectors.
2. Set up a n o rm a l-in te n s ity non-stored d is p la y o f the
signal in th e m anner given in " N o rm a l Sweep D is p la y ".
3. Set the Sweep M O D E to S IN G L E SWEEP.
4. Press in b o th STO RE b u tto n s .
5. W ith th e T IM E /D IV sw itch set to 10 ps (2 gs fo r
O p tio n 1 C R T ), ap p ly a single sweep o f th e trace b y
pressing th e R ESET b u tto n . N o te th a t a c o m p le te stored
d isp la y c a n n o t be o b ta in e d fo r any se ttin g o f th e IN T E N ­
S IT Y c o n tro l.
6. Depress b o th E N H A N C E b u tto n s , th e n s im u lta ­
neously press b o th ER A S E b u tto n s to clear th e storage
screens.
7 . W h ile repe a te d ly erasing and a p p ly in g single sweeps,
ad ju st th e E N H A N C E L E V E L c o n tro l s u ffic ie n tly c lo c k ­
wise to c o m p le te ly store th e d is p la y w it h o u t fa d in g up th e
ta rg e t excessively.
8. F o r in s tru m e n ts equipped w ith th e o p tio n 1 C R T , if
p o rtio n s o f th e C R T ta rg e t becom e faded up and ca n n o t be
erased in th e n o rm a l m anner due to in a d v e rte n t o p e ra tio n
in R e p e titiv e Sweep and Enhanced modes sim u lta n e o u s ly ,
proceed as fo llo w s :
S to re th e e n tire ta rg e t b y using a re p e titiv e sweep at
a p p ro x im a te ly 1 m s /D IV w ith In te n s ity at m id-range.
S lo w ly p o s itio n th e trace fro m to p to b o tto m to store th e
e n tire ta rg e t area. S w itch to Single-Sweep (o r non-enhanced
storage m ode) and erase. T h e target is n o w ready fo r
no rm a l storage o r single-sweep enhanced storage o p e ra tio n .
N O T E fo r O P T IO N O N E in s tru m e n ts
A f t e r sustained use (6 h o u rs o r m o re ) o f the O p tio n
One in s tru m e n t in th e N o n -S to re m ode o r in S to re
m o d e w ith n o th in g w ritte n , the w ritin g speed m a y be
im p ro v e d b y leaving the C R T ta rg e t f u lly sto re d fo r
fiv e to fifte e n m in u te s. This p ro c e d u re m a y be
repeated every fe w h o u rs to refresh the ta rg e t in
a p p lic a tio n s re q u irin g m a x im u m s to re d w ritin g ra te in
a usage w here the ta rg e t is sto re d a sm all percentage
o f the tim e.
A P P L IC A T IO N S
General
The fo llo w in g in fo rm a tio n describes the procedures and
techniques fo r m aking basic m easurements w ith a 434
O scilloscope. These a p p lic a tio n s are n o t described in d e ta il,
since each a p p lic a tio n m u st be adapted to the requirem ents
o f th e in d iv id u a l m easurem ent. T h is in s tru m e n t can also be
used fo r m a n y a p p lica tio n s w h ich are n o t described in this
m anual. C o n ta ct y o u r local T e k tro n ix F ield O ffic e or
representative fo r assistance in m aking sp e cific measure­
ments w ith this in s tru m e n t. A lso , the fo llo w in g books
describe oscilloscope m easurem ent techniques w h ich can be
adapted fo r use w ith th is in s tru m e n t.
H arley C arter, " A n In tro d u c tio n to th e C athode Ray
O s c illo s c o p e ", P h illip s Technical L ib ra ry , Cleaver-Hum e
Press L td ,, L o n d o n , 1960.
J. Czech, "O scillo sco p e Measuring T e c h n iq u e ", P h illip s
Technical L ib ra ry , Springer-V erlag, New Y o rk , 1965.
R o b e rt G. M id d le to n and L. D onald Payne, "U sin g the
O scilloscope in In d u s tria l E le c tro n ic s ", H ow ard W. Sams &
Co. Inc., The B o b b s-M e rrill C om pany In c., In d ia n a p o lis,
1961.
R ufus P. T u rn e r, "P ra c tic a l O scilloscope H a n d b o o k ",
V olum es 1 and 2, Jo h n F. Rider P ublisher In c., N ew Y o rk ,
1964.
Peak-to-Peak V oltage Measurements—AC
T o make peak-to-peak voltage m easurem ents, use the
fo llo w in g procedure:
1. A p p ly the signal to e ith e r in p u t co n n e c to r.
2. Set the V e rtic a l M ode sw itch to d isp la y the channel
used.
3. Set th e In p u t C o u p lin g sw itch to A C if the DC
c o m p o n e n t o f th e signal is large enough to s h ift th e d isp la y
o u t o f th e g ra tic u le area.
4. Set th e V O L T S /D IV sw itch to d is p la y a b o u t 3 to 8
d ivisio n s o f w a v e fo rm .
2-15