Multicheck6010
EN
- 74 -
Displayed results:
x1
(left)
Step 1 trip-out time result, t3 (I
ΔN
, 0º),
x1
(right)
Step 2 trip-out time result, t4 (I
ΔN
, 180º),
x5
(left)
Step 3 trip-out time result, t5 (5x IΔN, 00),
x5
(right)
Step 4 trip-out time result, t6 (5x IΔN, 1800),
x½
(left)
Step 5 trip-out time result, t1 (½xI
ΔN
, 00),
x½
(right)
Step 6 trip-out time result, t2 (½xI
ΔN
, 1800),
IΔ
(+)
Step 7 trip-out current ((+) positive polarity)
IΔ
(-)
Step 8 trip-out current ((-) negative polarity)
Uc
Contact voltage for rated IΔN.
Note:
•
the x1 Auto tests will be automatically skipped for RCD type B with rated residual
currents of IΔN = 1000 mA
•
the x5 Auto tests will be automatically skipped in the following cases:
•
RCD type AC with rated residual currents of IΔN = 1000 mA
•
RCD type A and B with rated residual currents of IΔN >= 300 mA
•
In these cases, the auto test result passes if the t1 to t4 results pass, and on the
display are omitted t5 and t6.
4.3.5 Warnings
•
Leakage currents in the circuit following the residual current device (RCD) may influence the
measurements.
•
Special conditions in residual current devices (RCD) of a particular design, for example of type S
(selective and resistant to impulse currents) shall be taken into consideration.
•
Equipment in the circuit following the residual current device (RCD) may cause a considerable
extension of the operating time. Examples of such equipment might be connected capacitors or
running motors.
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