Environnement AS32M, Техническое руководство, Страница: 40 / 186

Environnement
S.A
AS32M
Duplication prohibited
DECEMBER 2013
3–2
3.3.4.7 CONFIGURATION

Factory settings 3–40
3.3.5 STORED DATA 3–41
3.3.6 TESTS 3–44
3.3.6.1 TESTS

Chamber parameters 3–45
3.3.6.2 TESTS

Multiplexer (MUX) signals 3–46
3.3.6.3 TESTS

Other commands 3–47
3.3.6.4 TESTS

Arm7 inputs-outputs 3–48
3.3.7 STOP MODE 3–49
3.3.8 I2C CARD(S) 3–50
3.3.8.1 I2C CARD(S)

ESTEL Board 3–50
3.3.9 USB FLASH DRIVE 3–54
3.4 CALIBRATION 3–55
3.4.1 GENERAL 3–55
3.4.2 ZERO CHECKING 3–57
3.4.2.1 Equipment required 3–57
3.4.2.2 Procedure 3–57
3.4.2.3 Use of automatic cycles 3–57
3.4.3 CHECKING OF ONE SCALE POINT 3–58
3.4.3.1 Equipment required 3–58
3.4.3.2 Procedure 3–58
3.4.3.3 Use of automatic cycles 3–58
3.4.4 TWO-POINT CALIBRATION 3–58
3.4.4.1 Devices 3–58
3.4.4.2 Procedure 3–59
3.4.4.3 Use of Auto-calibration cycle 3–59
3.4.5 MULTI-POINT CALIBRATION 3–60
3.4.5.1 General 3–60
3.4.5.2 Equipment required 3–61
3.4.5.3 Procedure 3–61
3.4.6 NO2 INTERNAL PERMEATION BENCH (OPTIONAL) 3–64