Elnec BeeHive304, Руководство пользователя

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BeeHive304
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Technical specification
HARDWARE
Base unit, DACs
USB 2.0 high-speed compatible port, up to 480 Mb/s transfer rate
100Mbit LAN port
on-board intelligence: powerful processor (ARM9 400MHz) and FPGA based state machine
(basic clock 50 MHz plus PLL)
built-in mSATA SSD as internal buffer (1282GB, upgradeable to higher capacity) (*)
three D/A converters for VCC1, VCC2, and VPP, controllable rise and fall time
VCC1, VCC2 range 0.8V..7V/1A (step 10mV)
VPP range 0V..25V/1A (step 25mV)
Temperature controlled fans
selftest capability
protection against surge and ESD on power supply input, USB and LAN port and pins of
Programming Module Interface (PMI)(IEC1000-4-2: 15kV air, 8kV contact)
banana jack for ESD wrist straps connection
screw with two washers for connection to ground
(*) Note:
the data in the buffer are stored in fragments and also partially compressed, therefore the
buffer can keep standard data also for bigger size devices, than current size of the buffer
this upgrade is mechanically complicated and can be done at Elnec only
the programmers up to s/n 3004-00041(including) were supplied with 32GB SSD as
internal buffer
the 128GB SSD can store as a buffer roughly 110 GB of the random data (28 GB in case
of 32 GB SSD) for the bigger sizes SSD, proportionally. If you plan to work/copy
eMMC/NAND device, which might contain random data in full range of the device size, we
recommend to have equal capacity buffer in the programmer.
Pindriver (available on the programming module interface -
connectors for programming modules)
pindrivers: 64 universal
VCC1/VCC2 and VPP can be connected to each pin
perfect ground for each pin
2 independent FPGA based TTL driver provides H, L, CLK, pull-up, pull-down on all
pindriver pins, logic level 0,75V - 5V (IOL and IOH current 20mA)
logic signals frequency: up to 125MHz (3.3V), 80MHz (5V)
analog pindriver output level selectable from 0.8 V up to 25V
current limitation, overcurrent shutdown, power failure shutdown
continuity test: each pin is tested before every programming operation