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PROCESS SETUP AND ACCEPTANCE
P
ROCESS
M
ANUAL
3.4-6
3.4.2.3 Tempress Systems, Inc. LPCVD processes
LP-01 Ramped poly
test thickness: 3000Å
test temperature: 625
o
C (ramped)
time indication: 30 min
base: 1000Å dryoxide on Si wafer
testmethod: ellipsometer
LP-02 Flat poly
test thickness: 3000Å
test temperature: 610
o
C
time indication: 30 min
base: 1000Å dryoxide on Si wafer
testmethod: ellipsometer
LP-03 Sipos
test thickness: 2000Å
test temperature: 670
o
C (ramped)
time indication: 30 min
base: 1000Å dryoxide on Si wafer
testmethod: incremental thickness/mass method or ellipsometer
LP-04 Nitride
test thickness: 900Å (blue)
test temperature: 800
o
C (ramped)
time indication: 30 min
base: bare Si wafer
testmethod: ellipsometer
test thickness: 3000Å
test temperature: 850
o
C
time indication: 30 min
test refractive index: 2.15
test stress: <= 200MPa tensile
base: bare Si wafer
testmethod: ellipsometer, curvature
LP-05 Oxynitride
test thickness: 900Å
test temperature: 800
o
C
time indication: 30 min
test refractive index: 1.8
base: bare Si wafer
testmethod: ellipsometer