53
Chapter 3: Testing Performance
To test the multiple-clock state acquisition
b
In the oscilloscope timebase menu, select Position. Using the
oscilloscope knob, position the data waveform so the falling edge is near
the center of the display.
c
On the oscilloscope, select [Shift]
∆
Time, then select [Enter] to display
the setup time (
∆
Time(1)-(2)).
d
Adjust the pulse generator channel 1 Delay until the pulses are aligned
according to the setup time of the setup/hold combination selected,
+0.0 ps or –100 ps.
3
Select the clocks to be tested:
a
Click the
Sampling Setup icon. The Analyzer Setup dialog opens.
b
In the Sampling tab, click the Master button for one of the clocks and
select Rising Edge.
c
Repeat the above steps for each of the remaining clocks until all clocks
have been configured with Rising Edge.
Содержание 1680 series
Страница 13: ...13 Chapter 1 General Information Dimensions 1680A AD Series 1690A AD Series...
Страница 15: ...15 2 Preparing for Use This chapter gives you instructions for preparing the logic analyzer for use...
Страница 74: ...74 Chapter 3 Testing Performance Performance Test Record...
Страница 77: ...77 5 Troubleshooting This chapter helps you troubleshoot the logic analyzer to find defective assemblies...
Страница 142: ...142 Chapter 6 Replacing Assemblies 1690A AD series disassembly assembly...
Страница 146: ...146 Chapter 7 Replaceable Parts Exploded View Exploded view of the Agilent 1680A AD series logic analyzer...
Страница 153: ...153 Chapter 7 Replaceable Parts Exploded View Exploded view of the Agilent 1690A AD series logic analyzer...
Страница 159: ...159 8 Theory of Operation This chapter tells the theory of operation for the logic analyzer and describes the self tests...
Страница 172: ...172 Chapter 8 Theory of Operation Self Tests Descriptions...
Страница 174: ......