52
Chapter 3: Testing Performance
To test the multiple-clock state acquisition
b
On the oscilloscope, select [Shift] + width: channel 1, then select
[Enter] to display the data signal pulse width (+ width (1)).
c
If the pulse width is outside the limits, adjust the pulse generator
channel 2 width until the pulse width is within limits.
Check the setup/hold with single clock edges, multiple
clocks
The following setup/hold combinations will be tested.
Setup/Hold Combinations
1
Disable the pulse generator channel 1 COMP (LED off).
2
Using the Delay mode of the pulse generator channel 1, position the pulses
according to the setup time of the setup/hold combination selected,
+0.0 ps or
−
100 ps as measured on the oscilloscope:
a
On the Oscilloscope, select [Define meas] Define
∆
Time - Stop edge:
rising, Edge number 2.
Test
Combination
Setup/Hold
Times
Setup/Hold
Window
Sample Position
(in middle of Window)
1
5.0/-2.0 ns
3.0 ns
-3.5 ns
2
-1.5/4.50 ns
3.0 ns
+3.0 ns
Содержание 1680 series
Страница 13: ...13 Chapter 1 General Information Dimensions 1680A AD Series 1690A AD Series...
Страница 15: ...15 2 Preparing for Use This chapter gives you instructions for preparing the logic analyzer for use...
Страница 74: ...74 Chapter 3 Testing Performance Performance Test Record...
Страница 77: ...77 5 Troubleshooting This chapter helps you troubleshoot the logic analyzer to find defective assemblies...
Страница 142: ...142 Chapter 6 Replacing Assemblies 1690A AD series disassembly assembly...
Страница 146: ...146 Chapter 7 Replaceable Parts Exploded View Exploded view of the Agilent 1680A AD series logic analyzer...
Страница 153: ...153 Chapter 7 Replaceable Parts Exploded View Exploded view of the Agilent 1690A AD series logic analyzer...
Страница 159: ...159 8 Theory of Operation This chapter tells the theory of operation for the logic analyzer and describes the self tests...
Страница 172: ...172 Chapter 8 Theory of Operation Self Tests Descriptions...
Страница 174: ......