![background image](http://html1.mh-extra.com/html/zeiss/axio-examiner/axio-examiner_operating-manual_3326798076.webp)
OPERATION
Carl Zeiss
Docking station with TFT display
Axio Examiner
76
M60-2-0003 e 05/2012
•
Select the appropriate reflector from the list displayed in the
Configure reflector position # in the
reflector turret
popup window. You can read the current selection in the
Resulting configuration
line.
•
Press the button for
RL
and / or
TL
.
•
Press the
Save
button. A safety prompt will appear if the corresponding turret position has been
assigned before.
(2) Focus
Use this tab to set the focusing gear speed,
compensate objective parfocality, or switch
automatic parfocality compensation either on or
off.
(3) Misc(ellaneous)
This tab enables the operator to configure
additional optional components.
−
Illumination type
Here you can select the illumination to be
used.
−
External Shutter
Here you can enter whether you use an
external shutter.
−
Refractive Index Condenser Immersion
Here you can freely
configure a
refraction index for condenser immersion.
The refraction index entered here will be
displayed in the
Misc.
button under
Microscope –> Control -> Cond. focus
.
Figure 4-17 Settings –> Components ->
Focus page
Figure 4-18 Settings –> Components ->
Misc page
Summary of Contents for Axio Examiner
Page 1: ...Operating Manual Axio Examiner Research Microscope...
Page 20: ...EQUIPMENT DESCRIPTION Carl Zeiss System overview Axio Examiner 20 M60 2 0003 e 05 2012...
Page 21: ...EQUIPMENT DESCRIPTION Axio Examiner System overview Carl Zeiss M60 2 0003 e 05 2012 21...
Page 22: ...EQUIPMENT DESCRIPTION Carl Zeiss System overview Axio Examiner 22 M60 2 0003 e 05 2012...
Page 96: ......