Production Data
WM8580
w
PD, Rev 4.7, March 2009
11
Test Conditions
AVDD, PVDD, VREFP = 5V, DVDD = 3.3V, AGND, VREFN = 0V, PGND, DGND = 0V, T
A
= +25
o
C, 1kHz Signal, fs = 48kHz, 24-
Bit Data, Slave Mode, MCLK, ADCMCLK = 256fs, 1V
rms
Input Signal Level unless otherwise stated.
PARAMETER SYMBOL
TEST
CONDITIONS
MIN
TYP
MAX
UNIT
Analogue Reference Levels
Reference voltage
V
VMID
VREFP/2
–
50mV
VREFP/2 VREFP/2
+
50mV
V
VREFP to VMID and
VMID to VREFN
VMIDSEL = 1
14 k
Ω
Potential divider resistance
R
VMID
VREFP to VMID and
VMID to VREFN
VMIDSEL = 0
44 k
Ω
S/PDIF Transceiver Performance
Jitter on recovered clock
50
ps
S/PDIF Input Levels CMOS MODE
Input LOW level
V
IL
0.3 X DVDD
V
Input HIGH level
V
IH
0.7 X DVDD
V
Input capacitance
1.25
pF
Input Frequency
36
MHz
S/PDIF Input Levels Comparator MODE
Input capacitance
10
pF
Input resistance
23
k
Ω
Input frequency
25
MHz
Input Amplitude
200
0.5 X DVDD
mV
PLL
Period Jitter
80
ps(rms)
XTAL
Input XTI LOW level
VX
IL
0
557
mV
Input XTI HIGH level
VX
IH
853
mV
Input XTI capacitance
C
XJ
3.32
4.491
pF
Input XTI leakage
IX
leak
28.92
38.96
mA
Output XTO LOW
VX
OL
15pF load capacitors
86
278
mV
Output XTO HIGH
VX
OH
15pF load capacitors
1.458
1.942
V
Supply Current
Analogue supply current
AVDD, VREFP = 5V
45
mA
Analogue supply current
AVDD, VREFP = 3.3V
30
mA
Digital supply current
DVDD
=
3.3V 25 mA
Power Down
500
µ
A
Notes:
1.
Ratio of output level with 1kHz full scale input, to the output level with all zeros into the digital input, measured ‘A’
weighted.
2. All performance measurements done with 20kHz low pass filter, and where noted an A-weight filter. Failure to use
such a filter will result in higher THD+N and lower SNR and Dynamic Range readings than are found in the Electrical
Characteristics. The low pass filter removes out of band noise; although it is not audible, it may affect dynamic
specification values.
3.
VMID decoupled with 10uF and 0.1uF capacitors (smaller values may result in reduced performance).
4.
PSSR measured with VMID set to high impedance
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