104
FUNCTION SETTING USING SETTINGS SCREEN
Map of analysis
screen layout
button 1
Multi map
Layout 1 of measurement result screen is set to
Multi Maps.
Multi Maps
Ocular aberration map
Layout 1 of measurement result screen is set to
ocular aberration maps (Ocular Maps).
Corneal aberration
map
Layout 1 of measurement result screen is set to
corneal aberration maps (Corneal Maps).
Zernike vector map
Layout 1 of measurement result screen is set to
Zernike vector maps (Zernike Maps).
Summary map
Layout 1 of measurement result screen is set to
summary maps (Summary Maps).
Component map
Layout 1 of measurement result screen is set to
component maps (Component Maps).
IOL selection map
Layout 1 of measurement result screen is set to IOL
selection maps (IOL Selection Maps).
PSF/MTF map
Layout 1 of measurement result screen is set to
PSF/MTF maps (PSF/MTF Maps).
Corneal R/L map
Layout 1 of measurement result screen is set to Cor-
neal R/L maps.
Ocular R/L map
Layout 1 of measurement result screen is set to Ocu-
lar R/L maps.
Map of analysis
screen layout
button 2
Same as above.
Same as above except layout 1
layout 2.
Ocular
aberration
map
Map of analysis
screen layout
button 3
Same as above.
Same as above except layout 2
layout 3.
Corneal
aberration
map
Map of analysis
screen layout
button 4
Same as above.
Same as above except layout 3
layout 4.
Compo-
nent map
Corneal irregular
astig. 1
Set by ten-key display
First threshold value of corneal irregular astigmatism
is set.
0.3
Corneal irregular
astig. 2
Set by ten-key display
Second threshold value of corneal irregular astigma-
tism is set.
0.6
K Readings
Set by ten-key display
K threshold value is set.
0.5
Corneal SA
Set by ten-key display
Threshold value of corneal spherical aberration is
set.
0.1
Corneal astig.
Set by ten-key display
Threshold value of corneal astigmatism is set.
1.5
Set item display
Setting Change button
Set contents
Initial value
Page
Summary of Contents for KR-1W
Page 1: ...INSTRUCTION MANUAL WAVE FRONT ANALYZER KR 1W ...
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Page 188: ...KR 1W WAVE FRONT ANALYZER 41835 97992 Printed in Japan 2010 02 100LW2 ...