SLVS695D – JUNE 2007 – REVISED JANUARY 2015
7.5 Electrical Characteristics: V
DD
= 3 V
V
DD
= 3 V, T
J
= –40°C to 125°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
(1)
MAX
UNIT
V
DD
Input voltage
3
5.5
V
V
O
Supply voltage to the output pins
20
V
V
O
≥
0.6 V
3
I
O
Output current
mA
V
O
≥
1 V
120
I
OH
High-level output current, source
–1
mA
I
OL
Low-level output current, sink
1
mA
V
IH
High-level input voltage
0.7 × V
DD
V
DD
V
V
IL
Low-level input voltage
GND
0.3 × V
DD
V
T
J
= 25°C
0.5
I
leak
Output leakage current
V
OH
= 17 V
μ
A
T
J
= 125°C
2
V
OH
High-level output voltage
SDO, I
OL
= –1 mA
V
DD
– 0.4
V
V
OL
Low-level output voltage
SDO, I
OH
= 1 mA
0.4
V
V
OUT
= 0.6 V, R
ext
= 720
Ω
,
Output current 1
26
mA
CG = 0.992
I
OL
= 26 mA, V
O
= 0.6 V, R
ext
= 720
Ω
,
I
O(1)
Output current error, die-die
±3%
±6%
T
J
= 25°C
Output current skew, channel-to-
I
OL
= 26 mA, V
O
= 0.6 V, R
ext
= 720
Ω
,
±1.5%
±3%
channel
T
J
= 25°C
Output current 2
V
O
= 0.8 V, R
ext
= 360
Ω
, CG = 0.992
52
mA
I
OL
= 52 mA, V
O
= 0.8 V, R
ext
= 360
Ω
,
Output current error, die-die
±2%
±6%
I
O(2)
T
J
= 25°C
Output current skew, channel-to-
I
OL
= 52 mA, V
O
= 0.8 V, R
ext
= 360
Ω
,
±1.5%
±3%
channel
T
J
= 25°C
V
O
= 1 V to 3 V, I
O
= 26 mA
±0.1
I
OUT
vs
Output current vs
%/V
V
DD
= 3.0 V to 5.5 V,
V
OUT
output voltage regulation
±1
I
O
= 26 mA/120 mA
Pullup resistance
OE(ED2)
500
k
Ω
Pulldown resistance
LE(ED1)
500
k
Ω
T
sd
Overtemperature shutdown
(2)
150
175
200
°C
T
hys
Restart temperature hysteresis
(2)
15
°C
Threshold current for open error
0.5 ×
I
OUT,Th
I
OUT,target
= 3 mA to 120 mA
detection
I
target
%
Trigger threshold voltage for
V
OUT,TTh
short-error detection
I
OUT,target
= 3 mA to 120 mA
2.5
2.7
3.1
V
(TLC5917 only)
Return threshold voltage for
V
OUT, RTh
short-error detection
I
OUT,target
= 3 mA to 120 mA
2.2
V
(TLC5917 only)
R
ext
= Open
5
10
R
ext
= 720
Ω
8
14
I
DD
Supply current
mA
R
ext
= 360
Ω
11
18
R
ext
= 180
Ω
16
22
(1)
Typical values represent the likely parametric nominal values determined at the time of characterization. Typical values depend on the
application and configuration and may vary over time. Typical values are not ensured on production material.
(2)
Specified by design.
Copyright © 2007–2015, Texas Instruments Incorporated
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