Refraction Technology 130-01, Operation Manual

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Doc-1301-Ops Rev 2.9.1 10/30/08
Refraction Technology, Inc. 81
4.10 To Test the 130 DAS Memory
4.10.1 Overview
This Section explains the how the Memory Test (MT) command is handled in
the REF TEK 130-01 DAS.
4.10.2 Memory test process
The Memory Test Command causes the REF TEK 130-01 to perform a
memory test on data and buffer memory. Since the test overwrites any
existing data, the DAS performs several actions prior to starting the actual
test. Acquisition is stopped (if currently active), the DAS attempts to dump
all recorded data and processes not required to perform the memory test are
stopped.
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Memory is checked using 0xAA, 0x55 and incremental data patterns.
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If an error is detected, the test is stopped immediately and the DAS responds with
the FAIL result code and failing address.
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Upon successful completion of the test, the DAS responses with the PASS result code
and 0x00000000 as the failing address.
Note: The test status and the PASS/FAIL results are also available on the LCD
display.
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After a 20 second delay the system automatically reboots.
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All configuration parameters are restored to the conditions prior to the MT command
being issued. This includes starting acquisition, if it was running prior to receipt of
the command.