NXP Semiconductors MC92602, User Manual, Page: 29 / 48

Test Setups
MC92602 Reduced Interface SerDes Design Verification Board User’s Guide, Rev. 3
Freescale Semiconductor 4-3
4.2 Jitter Testing
The following tests are guidelines for verifying the performance of the MC92602 in ‘noisy’ conditions.
Results will vary depending on input reference frequencies, MC92602 mode of operation, test setup and
equipment, and test environment.
4.2.1 Jitter Test System Calibration
Before beginning any type of jitter measurements, the system must first be calibrated, as shown in
Figure 4-3 , to produce the desired frequency and amplitude modulation of the jittered source. The
amplitude of modulation is then translated into jitter in units of peak-to-peak unit intervals (UIp-p).
Different synthesized sweepers have different characteristics at different frequencies. It is possible that
certain frequencies will produce spurious side lobes which will affect jitter characterization. It is strongly
advised that a bandpass filter centered on the carrier frequency be used at the input to the microwave
transition analyzer. Refer to the synthesized sweeper reference Guide for more details.
Figure 4-3. Jitter Measurement System Calibration
Function
Generator
Mo
du
la
ti
on
Si
g
n
a
l
10
-MHz Ref
e
rence Cl
oc
k
HPIB
Power
Splitter
Jittered
Clock
Filter
Synthesized
Sweeper
(Carrier Frequency)
70000 Mainframe
with Microwave
Transition Analyzer
Ch1
Ch2
50
Ω