6
Installation and Operation
EDBC250SIO | 2.0
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6.3.3
Input Parameters
Parameters "Used Inputs" and "External Inputs"
CAUTION
Maximum state change time of the application
For single-channel applications (inputs and outputs), the test pulse frequency
must be adapted to the application. It must be ensured that for applications in
which a frequent change of state occurs, the test pulse frequency is selected at
least 100 times greater than the state change time of the application.
See 6.3.2 FSoE Parameters.
Use these parameters to enable the inputs of the Safety I/O-module and to select the input
function. Use parameter "External Inputs" to disable the module's test pulse outputs that
deliver test pulses to each of the inputs. Use this setting for sensors generating their own test
pulses (some light barriers, for example).
WARNING
Non-detection of a corrupt external wiring when test pulse outputs are
disabled
Unsafe machine state, safety hazard
Always use the correct and enabled test pulse output to supply power to
contact-type sensors.
Note: Consider protecting the cables and/or laying them separately to
ensure a sufficient degree of safety.
In "Mode Selector" mode, you can connect 2, 3 or 4 inputs to test pulse output SI0 TP and to a
mode selector. Disable the test pulse outputs you do not need. Refer to manual section
►
7.4
Mode Selector for a wiring example. Inputs you do not use and the associated test pulse
outputs can be used for other functions.
"Pressure-sensitive Mat/Bumper" mode uses pairs of 2 inputs and the associated test pulse
outputs. Parameter "External Input" allows you to separately choose the function of inputs 0 &
1 and 2 & 3. Inputs you do not use and the associated test pulse outputs can be used for other
functions. Refer to manual section
►
7.5 Safety Mats, Connecting Blocks and Bumpers for a
wiring example.
Parameter "Test pulse duration input"
If used together with the module's test pulse outputs, test pulses cyclically check the input
circuit connected to the Safety I/O-module for faults such as short circuits or internal defects.
Parameter "Test pulse duration output" sets the time of a test pulse allocated to a digital test
pulse output. It also sets the filtering time of the digital inputs. You may have to modify the
test pulse duration if the signals are affected by capacitive properties of the input circuit, for
example.
Parameter "Test frequency input"
If used together with the module's test pulse outputs, test pulses cyclically check the input
circuit connected to the Safety I/O-module for faults such as short circuits or internal defects.
Parameter "Test pulse duration input" sets the switching frequency and, thus, the frequency of
test pulses allocated to a digital test pulse output.
