1000BASE-T/100BASE-TX/10BASE-T Physical Layer Compliance Tests Manual
Intel Confidential
141
100Base-TX Test Procedure for the 82544 Chip
I.4.4
Test Fixtures
100 Ohm UTP Test Load. Fixture: F9.1.2.A.
I.4.5
Test Procedure
1. Connect the test equipment and Unit Under Test (UUT), as shown in
.
2. Use software or firmware control to force the unit under test to transmit frames in 100BASE-
TX mode.
3. Configure the oscilloscope according to
.
Table I-3. For Positive Peak Differential Output Amplitude
Table I-4. For Negative Peak Differential Output Amplitude
I.4.6
Notes for Using Pulse-Width Triggering
Note:
Most of the following procedure is very similar to the procedure for 9.1.2.1 Differential Output
Voltage (
) except: (1) the horizontal scale is only 1 nsec per division, and (2) the
operator is required to scroll left and right through the pulse -- to see if the MLT mid-level
shoulders are at least 20 nsec wide on both sides of the pulse; AND for rise and fall times, the
operator must make several different plots with both horizontal cursors and “cross-hair” cursors.
1. Set the trigger level to ~500 mV.
2. Select Pulse-Width triggering.
3. Start with the upper bound at ~118 nsec, and the lower bound at ~106 nsec.
4. Set the Trigger Mode to NORMAL.
Scope Parameter
Setting
Horizontal Scale
1 ns/division
Vertical Range
-100 mV to +1100 mV (1200 mV over the full vertical scale)
Vertical Position
-3.5 divisions to -4.0 divisions
Trigger Type
Positive, Pulse Width Triggering:
~116 ns lower bound, ~124 ns upper bound
(If shorter pulses are used, the lower bound may be lowered.)
Trigger Level
+500 mV
Trigger Signal
Differential signal at the pins of the test load.
Scope Parameter
Setting
Horizontal Scale
1 ns/division
Vertical Range
-1100 mV to +100 mV (1200 mV over the full vertical scale)
Vertical Position
+3.5 divisions to +4.0 divisions
Trigger Type
Negative, Pulse Width Triggering:
~116 ns lower bound, ~124 ns upper bound
(If shorter pulses are used, the lower bound may be lowered.)
Trigger Level
-500 mV
Trigger Signal
Differential signal at the pins of the test load.