ELTRA CS-800, Manual

Page: 72 / 158

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3.29.2
99B
Copper oxide has a bad quality
Fig. 25: Programm screenshot (graph example 2)
Memory effects of the copper oxide can cause tailing of the low carbon range in the
level of 10 to 50 mV. However the tailing level does not grow due to faulty copper
oxide.
Possible solution:
-Replace the copper oxide
3.29.3
100B
Path window is not sealed or it is broken
If the faulty window is on the chopper housing side, all available cells have a tailing
due to combustion gases entering the chopper housing causing permanent IR
absorption for all cells available.
If the faulty window is on the IR sensor side, there is tailing of the damaged cell
only.
Solution:
-Replace the part having the faulty window.
Replacing the window only, is rather tricky because the window should be
available, the faulty window must be removed, the surface for gluing new window
must be cleaned from old glue and rests of the broken window, there must be glue
available being suitable to glue windows (two components glue) and time should
also be available to wait until the glue is solid.