Digital Equipment VAXft Systems 810, Service Information

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Table 3–28 (Cont.) CPU ROM-Based Diagnostic Descriptions
Group Test Subtest Description
G: 0 T: 7 S: 5 DMA Sub-Trasfer Length Test
G: 0 T: 7 S: 6 DMA I/O Byte Alignment Test
G: 0 T: 7 S: 7 DMA Memory Byte Alignment Test
G: 0 T: 7 S: 8 DMA Maximum Transfer Length Test
G: 0 T: 8 XLINK Test
G: 0 T: 8 S: 0 XLINK Serial Cross-link Internal Loopback Test - Part 1
G: 0 T: 8 S: 1 XLINK Serial Cross-link Internal Loopback Request Test
G: 0 T: 8 S: 2 XLINK Serial Cross-link Internal Loopback Reply Test
G: 0 T: 8 S: 3 XLINK Serial Cross-link Internal Loopback Query Test
G: 0 T: 8 S: 4 XLINK Serial Cross-link External Loopback Test
G: 0 T: 8 S: 5 XLINK Serial Cross-link Communication Register Test
G: 0 T: 9 RESET Test
G: 0 T: 9 RESET CPU Module Hard Reset Test
G: 1 Zone Test
G: 1 T: 0 ACCESS Test
G: 1 T: 0 S: 0 ACCESS Parallel Xlink Loopback Test
G: 1 T: 0 S: 1 ACCESS I/O Module PATH ACCESS Test
G: 1 T: 0 S: 2 ACCESS I/O Module SSC Console Uart Test
G: 1 T: 1 DMA Test
G: 1 T: 2 INTERRUPT Test
G: 1 T: 3 ERROR Test
G: 1 T: 3 S: 0 ERROR I/O Crosscheck Test
G: 1 T: 4 RESET Test
G: 1 T: 4 S: 0 RESET CPU Module Zone Reset Test
G: 1 T: 4 S: 1 RESET I/O Module Reset Test
G: 2 System Test
G: 2 T: 0 Cross-link Mode Test
G: 2 T: 0 S: 0 Zone A (MASTER -> RESYNC MASTER -> DUPLEX)
Mode Test
G: 2 T: 0 S: 1 Zone B (MASTER -> RESYNC MASTER -> DUPLEX)
Mode Test
G: 2 T: 1 Zone A MASTER - Zone B SLAVE Mode Test
G: 2 T: 1 S: 0 ACCESS I/O Module Path Access Test
G: 2 T: 1 S: 1 ACCESS I/O Module SSC Console Uart Test
G: 2 T: 1 S: 2 ERROR I/O Crosscheck Test
G: 2 T: 2 Zone A RESYNC_MASTER - Zone B RESYNC_SLAVE
Mode Test
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System Maintenance 3–33