Chauvin Arnoux C.A 6116, User Manual

Page: 78 / 96

78
Domain of use of the ranges for a mains voltage between 280 and 500 v
rms
.
I 10 mA 30 mA 100 mA 300 mA 500 mA 650 mA 1000 mA variable
I
D N
Ramp or
pulse
      
I
D
N
≤ 500 mA
2 x I
D
N
Pulse
       I
D N
≤
250 mA
5 x I
D
N
Pulse
      
I
D N
≤
100 mA
Characteristics in pulse mode:
Range I
D
N
10 mA - 30 mA - 100 mA - 300 mA - 500 mA - 650 mA - 1000 mA
Variable (6 to 999 mA)
Nature of the test Determination of U
F
Non-tripping test Tripping test
Tripping test (se-
lective)
Tripping test
Test current 0.2 x I
D N
… 0.5 x I
D N
9
0.5 x I
D N
I
D N
2 x I
D N
5 x I
D N
Intrinsic uncertainty on the test
current +0 -7%
± 2 mA
+0 -7%
± 2 mA
-0 +7%
± 2 mA
-0 +7%
± 2 mA
-0 +7%
± 2 mA
Maximum duration of applica-
tion of the test current from 32 to 72
periods
1000 or 2000 ms 500 ms 500 ms 40 ms
9: this current can be adjusted in steps of 0.1 I
D N
and must not be less than 2,4 mA. As default, this current is 0.4 I
D N
.
Characteristics in ramp mode:
Range I
D
N
10 mA - 30 mA - 100 mA - 300 mA - 500 mA - 650 mA - 1000 mA
Variable (6 to 999 mA)
Nature of the test Determination of U
F
Tripping test
Test current 0.2 x I
D
N
… 0.5 x I
D
N
10
0.9573 x I
D
N
x k / 28
11
Intrinsic uncertainty on the test
current
+0 -7% ± 2 mA -0 +7% ± 2 mA
Maximum duration of applica-
tion of the test current
from 32 to 72 periods
4600 ms to 50 and 60 Hz
4140 ms to 16.6 Hz
Intrinsic uncertainty on the in-
dication of the tripping current
-
-0 +7% + 3.3 % I
D N
± 2 mA
Resolution de 0.1 mA up to 400 mA
and 1 mA thereafter
10: can be parameterized by the user.
11: k is between 9 and 31. The waveform so generated goes from 0.3 I
D N
to 1.06 I
D N
in 22 steps of 3.3% I
D N
each having a duration
of 200 ms (180 ms at 16.66Hz).
Characteristics of the trip time (t
A
):
Pulse mode Ramp mode
Measurement range 5.0 - 399.9 ms 400 - 500 ms 10.0 - 200.0 ms
Resolution 0.1 ms 1 ms 0.1 ms
Intrinsic uncertainty ± 2 ms ± 2 ms
Operating uncertainty ± 3 ms ± 3 ms