Application Information
TSEV83102G0B - Evaluation Board User Guide
4-5
2166B–BDC–04/03
The expected diode mounted transistors V
DIODE
value (including chip parasitic resis-
tance) versus junction temperature is given in Figure 4-6 (I
DIODE
= 1 mA).
Figure 4-6. Junction Temperature Versus Diode Voltage for I = 1 mA
Note:
The operating die junction temperature must be kept below 125
°
C; therefore, an ade-
quate cooling system has to be set up.
4.8
Decimation
Function
The decimation function can be used for debug of the ADC at initial stages. This function
indeed allows to reduce the ADC output rate by 32, thus allowing for a quick debug
phase of the ADC at maximum speed rate.
When active, this fuction makes the ADC output only 1 out of 32 data, thus resulting in a
data rate which is 32 times slower than the clock rate.
4.9
Pattern
Generator
Enable
The TS83102G0B is able to generate by itself (without any analog input signal) a serie
of patterns. If the TEST input is left floating or tied to GND the TS83102G0B will digitize
the analog input signal according to B/GB. If this input is driven with ECL low level or
tied to V
EE
, TS83102G0B will generate Checker Board patterns.
Use the jumper denoted TEST for enabling the pattern generator.
790
0
-10
20
10
40
30
60
50
80
70
100
90
110
810
830
850
870
890
910
930
800
820
840
860
880
900
920
940
Diode Voltage (mV)
Junction Temperature (
°
C)
