Debug Support
ARM DDI0145B
Copyright © 1998, 1999 ARM Limited. All rights reserved.
5-19
5.6
Test data registers
The following test data registers may be connected between
TDI
and
TDO
:
•
.
•
ARM9TDMI device identification (ID) code register
.
•
•
•
These are described below.
5.6.1
Bypass register
Purpose
Bypasses the device during scan testing by providing a path
between
TDI
and
TDO
.
Length
1 bit.
Operating mode
When the BYPASS instruction is the current instruction in the
instruction register, serial data is transferred from
TDI
to
TDO
in
the SHIFT-DR state with a delay of one
TCK
cycle. There is no
parallel output from the bypass register. A logic 0 is loaded from
the parallel input of the bypass register in CAPTURE-DR state.
5.6.2
ARM9TDMI device identification (ID) code register
Purpose
Reads the 32-bit device identification code. No programmable
supplementary identification code is provided.
Length
32 bits.
Operating mode
When the IDCODE instruction is current, the ID register is
selected as the serial path between
TDI
and
TDO
. There is no
parallel output from the ID register. The 32-bit identification code
is loaded into the register from the parallel inputs of the
TAPID[31:0]
input bus during the CAPTURE-DR state.
Summary of Contents for ARM9TDMI
Page 6: ...Contents vi Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 12: ...Preface xii Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 16: ...Introduction 1 4 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 22: ...Programmer s Model 2 6 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 110: ...Test Issues 6 6 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 154: ...Index Index 4 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...