Debug in Depth
ARM DDI 0210C
Copyright © 2001, 2004 ARM Limited. All rights reserved.
B-21
The following scan chain control signals can also be used for scan chain 3:
nHIGHZ
This signal can be used to drive the outputs of the scan cells to the HIGH
impedance state. This signal is driven LOW when the HIGHZ instruction
is loaded into the instruction register and HIGH at all other times.
RSTCLKBS
This signal is active when the TAP controller state machine is in the
RESET-TEST LOGIC state. It can be used to reset any additional scan
cells.
In addition to these control outputs,
SDINBS
output and
SDOUTBS
input are also
provided. When an external scan chain is in use,
SDOUTBS
must be connected to the
serial data output of the external scan chain and
SDINBS
must be connected to the serial
data input of the scan chain.
Summary of Contents for ARM7TDMI
Page 6: ...Contents vi Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...
Page 10: ...List of Tables x Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...
Page 14: ...List of Figures xiv Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...
Page 46: ...Introduction 1 26 Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...
Page 120: ...Coprocessor Interface 4 18 Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...
Page 142: ...Debug Interface 5 22 Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...
Page 282: ...Glossary Glossary 6 Copyright 2001 2004 ARM Limited All rights reserved ARM DDI 0210C ...