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App-15
IM DL35O-03EN
Appendix
1
2
3
4
5
6
App
Index
16-CH Temperature/Voltage Input Module
Rate at Which Data Is Written to the Acquisition Memory
Number of Sub Channels Used
1 to 16
Data Update Interval
100 ms
300 ms
1 s
3 s
Main Channel
Sample Rate Setting (S/s)
100 M
100 k
100 k
100 k
100 k
50 M
100 k
100 k
100 k
100 k
20 M
100 k
100 k
100 k
100 k
10 M
100 k
100 k
100 k
100 k
5 M
100 k
100 k
100 k
100 k
2 M
100 k
100 k
100 k
100 k
1 M
50 k
50 k
50 k
50 k
500 k
20 k
20 k
20 k
20 k
200 k
10 k
10 k
10 k
10 k
100 k
5 k
5 k
5 k
5 k
50 k
2 k
2 k
2 k
2 k
20 k
1 k
1 k
1 k
1 k
10 k
500
500
500
500
5 k
200
200
200
200
2 k
100
100
100
100
1 k
50
50
50
50
500
20
20
20
20
200
10
10
10
10
100
5
5
5
5
50
2
2
2
2
20
1
1
1
1
10
–
–
–
–
5
–
–
–
–
: Some data will not be updated. If this occurs, previous data is displayed consecutively.
If you set the sample rate (the main channel sample rate setting) of this instrument to a rate that
exceeds the data update rate, all data within the sub channel data update interval will be the same.
Appendix 2 Relationship between the Main Channel Sample Rate, Sub Channel Data Update Rate, and Acquisition Memory Writing Rate