Electrical characteristics
STM32L151x6/8/B, STM32L152x6/8/B
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DocID17659 Rev 10
6.3.3 Embedded
internal reference voltage
The parameters given in the following table are based on characterization results, unless
otherwise specified.
Table 15. Embedded internal reference voltage calibration values
Calibration value name
Description
Memory address
VREFINT_CAL
Raw data acquired at
temperature of 30 °C, V
DDA
= 3 V
0x1FF8 0078-0x1FF8 0079
Table 16. Embedded internal reference voltage
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
V
REFINT out
(1)
Internal reference voltage
– 40 °C < T
J
< +105 °C 1.202 1.224 1.242
V
I
REFINT
Internal reference current consumption
-
-
1.4
2.3
µA
T
VREFINT
Internal reference startup time
-
-
2
3
ms
V
VREF_MEAS
V
DDA
and V
REF+
voltage during V
REFINT
factory measure
-
2.99
3
3.01
V
A
VREF_MEAS
Accuracy of factory-measured V
REF
value
(2)
Including uncertainties
due to ADC and
V
DDA
/V
REF+
values
-
-
±5
mV
T
Coeff
(3)
Temperature coefficient
–40 °C < T
J
< +105 °C
-
20
50
ppm/°C
0 °C < T
J
< +50 °C
-
-
20
A
Coeff
Long-term stability
1000 hours, T= 25 °C
-
-
1000
ppm
V
DDCoeff
Voltage coefficient
3.0 V < V
DDA
< 3.6 V
-
-
2000
ppm/V
T
S_vrefint
(3)(4)
ADC sampling time when reading the
internal reference voltage
-
5
10
-
µs
T
ADC_BUF
Startup time of reference voltage buffer
for ADC
-
-
-
10
µs
I
BUF_ADC
Consumption of reference voltage
buffer for ADC
-
-
13.5
25
µA
I
VREF_OUT
VREF_OUT output current
(5)
-
-
-
1
µA
C
VREF_OUT
VREF_OUT output load
-
-
-
50
pF
I
LPBUF
Consumption of reference voltage
buffer for VREF_OUT and COMP
-
-
730
1200
nA
V
REFINT_DIV1
1/4 reference voltage
-
24
25
26
% V
REFINT
V
REFINT_DIV2
1/2 reference voltage
-
49
50
51
V
REFINT_DIV3
3/4 reference voltage
-
74
75
76
1. Tested in production.
2. The internal V
REF
value is individually measured in production and stored in dedicated EEPROM bytes.
3. Guaranteed by design, not tested in production.
4. Shortest sampling time can be determined in the application by multiple iterations.
5. To guarantee less than 1% VREF_OUT deviation.