DocID17659 Rev 10
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STM32L151x6/8/B, STM32L152x6/8/B
Electrical characteristics
103
dOffset/dT
Offset error temperature
coefficient (code 0x800)
V
DDA
=
3.3V, T
A
= 0 to 50
°
C
DAC output buffer OFF
-20
-10
0
µV/°C
V
DDA
=
3.3V, T
A
= 0 to 50
°
C
DAC output buffer ON
0
20
50
Gain
Gain error
(7)
C
L
≤
50 pF, R
L
≥
5 k
Ω
DAC output buffer ON
-
+0.1 /
-0.2%
+0.2 / -0.5%
%
No R
LOAD
, C
L
≤
50 pF
DAC output buffer OFF
-
+0 / -0.2%
+0 / -0.4%
dGain/dT
Gain error temperature
coefficient
V
DDA
=
3.3V, T
A
= 0 to 50
°
C
DAC output buffer OFF
-10
-2
0
µV/°C
V
DDA
=
3.3V, T
A
= 0 to 50
°
C
DAC output buffer ON
-40
-8
0
TUE
Total unadjusted error
C
L
≤
50 pF, R
L
≥
5 k
Ω
DAC output buffer ON
-
12
30
LSB
No R
LOAD
, C
L
≤
50 pF
DAC output buffer OFF
-
8
12
t
SETTLING
Settling time (full scale:
for a 12-bit code
transition between the
lowest and the highest
input codes till
DAC_OUT reaches final
value ±1LSB
C
L
≤
50 pF, R
L
≥
5 k
Ω
-
7
12
µs
Update rate
Max frequency for a
correct DAC_OUT
change (95% of final
value) with 1 LSB
variation in the input
code
C
L
≤
50 pF, R
L
≥
5 k
Ω
-
-
1
Msps
t
WAKEUP
Wakeup time from off
state (setting the ENx bit
in the DAC Control
register)
(8)
C
L
≤
50 pF, R
L
≥
5 k
Ω
-
9
15
µs
PSRR+
V
DDA
supply rejection
ratio (static DC
measurement)
C
L
≤
50 pF, R
L
≥
5 k
Ω
-
-60 -35
dB
1. Data based on characterization results.
2. Connected between DAC_OUT and V
SSA
.
3. Difference between two consecutive codes - 1 LSB.
4. Difference between measured value at Code i and the value at Code i on a line drawn between Code 0 and last Code 4095.
5. Difference between the value measured at Code (0x800) and the ideal value = V/2.
6. Difference between the value measured at Code (0x001) and the ideal value.
7. Difference between ideal slope of the transfer function and measured slope computed from code 0x000 and 0xFFF when
buffer is OFF, and from code giving 0.2 V and (V
DDA
– 0.2) V when buffer is ON.
Table 57. DAC characteristics (continued)
Symbol
Parameter
Conditions
Min
Typ
Max
Unit