R01UH0823EJ0100 Rev.1.00
Page 1797 of 1823
Jul 31, 2019
RX23W Group
51. Electrical Characteristics
Note:
The characteristics apply when no pin functions other than A/D converter input are used. Absolute accuracy includes
quantization errors. Offset error, full-scale error, DNL differential non-linearity error, and INL integral non-linearity error do not
include quantization errors.
Note 1. The conversion time is the sum of the sampling time and the comparison time. As the test conditions, the number of sampling
states is indicated.
Table 51.43
A/D Conversion Characteristics (4)
Conditions: 2.4 V ≤ VCC = VCC_USB = AVCC0 = VCC_RF = AVCC_RF ≤ 3.6 V, 2.4 V ≤ VREFH0 ≤ AVCC0,
VSS = AVSS0 = VSS_USB = 0 V, reference voltage = VREFH0 selected, T
a
= –40 to +85°C
Item
Min.
Typ.
Max.
Unit
Test Conditions
Frequency
1
—
16
MHz
Resolution
—
—
12
Bit
Conversion time*
(Operation at
PCLKD = 16 MHz)
Permissible signal
source impedance
(Max.) = 2.2 kΩ
3.38
—
—
μs
High-precision channel
The ADCSR.ADHSC bit is 1
The ADSSTRn register is 0Dh
5.06
—
—
Normal-precision channel
The ADCSR.ADHSC bit is 1
The ADSSTRn register is 28h
Analog input capacitance
Cs
—
—
15
pF
Pin capacitance included
Figure 51.58
Analog input resistance
Rs
—
—
2.5
kΩ
Offset error
—
±0.5
±4.5
LSB
Full-scale error
—
±0.75
±4.5
LSB
Quantization error
—
±0.5
—
LSB
Absolute accuracy
—
±1.25
±5.0
LSB
High-precision channel
±8.0
LSB
Other than above
DNL differential non-linearity error
—
±1.0
—
LSB
INL integral non-linearity error
—
±1.0
±3.0
LSB