Olympus USPM-RUIII Series, Руководство по эксплуатации оборудования

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9. Details of [System] Menu
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9. Details of [System] Menu
The basic equation for seeking spectral reflectances using the USPM-RU is indicated further below. The
spectral reflectance of a sample is calculated with reference to the known reflecting plane of the
reference, and based on the spectral reflection intensity of the reference, spectral reflection intensity of
the sample, and spectral intensity of the background.
) (
) ( ) (
) ( ) (
) (

 
 

theory
background reference
background sample
R
I I
I I
R




R
( )

: Measured spectral reflectance data
I
sample ( )

: Spectral reflection intensity of the sample
) (

reference
I
: Spectral reflection intensity of the reference
) (

background
I
: Spectral reflection intensity of the background
R
theory ( )

: Theoretical spectral reflectance data of the reference
9.1. [Reference Setting] menu
Displays the
[Reference setting]
window, where the theoretical reflectance of the reference to be
used in calculating spectral reflectances is specified.
9.1.1. [Dispersion] tab
Specify the data to be used for calculating the theoretical reflectance of the reference. Specify any