Information Manual
DSP1611/17/18/27/28/29 DIGITAL SIGNAL PROCESSOR
April 1998
JTAG Test Access Port
Lucent Technologies Inc.
DRAFT COPY
11-13
11.3 Elements of the JTAG Test Logic
(continued)
11.3.4 The Boundary-Scan Register—JBSR (continued)
5-4207
Figure 11-6. Cell Interconnections for a 3-State Pin
OUTPUT PIN
DI
PO
SO
PIN
OUTPUT
O CELL
SI
PIN OUTPUT ENABLE
TO NEXT CELL
CHIP OUTPUT
OE CELL
OEI
POE
SO
SI
CHIP OUTPUT ENABLE
FROM PREVIOUS CELL
OUTPUT
BUFFER
Содержание DSP1611
Страница 18: ...Chapter 1 Introduction...
Страница 27: ...Chapter 2 Hardware Architecture...
Страница 52: ...Chapter 3 Software Architecture...
Страница 116: ...Chapter 4 Instruction Set...
Страница 154: ...Chapter 5 Core Architecture...
Страница 176: ...Chapter 6 External Memory Interface...
Страница 208: ...Chapter 7 Serial I O...
Страница 237: ...Chapter 8 Parallel I O DSP1617 Only...
Страница 261: ...Chapter 9 Parallel Host Interface PHIF DSP1611 18 27 28 29 Only...
Страница 275: ...Chapter 10 Bit I O Unit...
Страница 284: ...Chapter 11 JTAG Test Access Port...
Страница 306: ...Chapter 12 Timer...
Страница 313: ...Chapter 13 Bit Manipulation Unit...
Страница 325: ...Chapter 14 Error Correction Coprocessor DSP1618 28 Only...
Страница 350: ...Chapter 15 Interface Guide...
Страница 367: ...Appendix A Instruction Encoding...
Страница 379: ...Appendix B Instruction Set Summary...
Страница 381: ...aD extractz aS IM16 B 52 aD insert aS arM B 53 aD insert aS IM16 B 54 aD aS aaT B 55...
Страница 437: ...Index...