Keysight Technologies B2900 Series, Руководство пользователя

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Keysight B2900 User’s Guide, Edition 5 4-35
Front Panel Reference
Function key group
Fail on Only for compliance check. OUT or IN.
Fail on=IN judges limit test failure if the channel goes into the
compliance state.
Fail on=OUT judges limit test failure if the channel comes out
of the compliance state.
Fail Pattern Only for compliance check. Bit pattern for the limit test fail
state.
Up Pattern Not available for compliance check. Bit pattern for the
failed-by-exceeding-upper-limit state. Used for the GRADING
mode.
Up Limit Not available for compliance check. Upper limit for the
pass/fail judgement. Used for the GRADING mode.
Low Pattern Only for limit test. Bit pattern for the
failed-by-exceeding-lower-limit state. Used for the GRADING
mode.
Low Limit Only for limit test. Lower limit for the pass/fail judgement.
Used for the GRADING mode.
Bit pattern is sent to the DIO pins specified by the GPIO Pins field on the Composite
Limit Test Setup dialog box.