Johnson Controls IFC-3030, Руководство по программированию

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74 IFC-3030 Programming Manual — P/N 52025:C 08/05/2005
Alter Status Walk Test
This screen appears when
DEVICES
is chosen as a parameter at the Walk Test Menu. The chosen
settings are displayed (
BASIC, AUDIBLE
in Figure 4.11).
Soft Keys
DEVICE:
Press this key to type the desired detector address into the underlined field.
NEXT POINT:
Press this key to bring up the next installed address for an addressable detector into
the
DEVICE
field.
PREVIOUS POINT:
Press this key to bring up the previous installed address of an addressable
detector into the
DEVICE
field.
ACCEPT:
Press this key to begin Walk Test, and to proceed to the Devices Test Selection screen
(Figure 4.12).
4.6.4 Devices Test Selection
Figure 4.12 Devices Test Selection Screen
Soft Keys
START TROUBLE TEST:
Press this key to generate a Trouble on the selected detector.
START ALARM TEST:
Press to generate an Alarm on the selected detector.
START OBSCURATION TEST:
Press to perform an Obscuration Test on the selected Beam
detector. (Beam detectors only.)
ABORT:
Press to stop the Walk Test.
T R O U B L E
P R O G M O D E A C T I V A T E D
1 0 : 2 2 : 3 4 A F R I S E P 2 4 , 2 0 0 4
W A L K T E S T I N P R O G R E S S
S E T T I N G S : B A S I C , A U D I B L E , P A N E L
S T A R T T R O U B L E T E S T
S T A R T A L A R M T E S T
S T A R T O B S C U R A T I O N T E S T A B O R T
This field will appear only for a beam detector with an integral sensitivity test feature.
NOTE: The Trouble, Alarm and Obscuration tests described above are additional tools provided to
ascertain the functionality of a detector. They are not a substitute for periodic maintenance and
sensitivity verification per NFPA 72.