Appendix C
Test Patterns and Loop Codes
Test patterns
CT-650 Command-Line Reference Guide
Release 9.4
197
X
X
X
PRBS 63
63-bit pseudorandom pattern generates a maximum of 5
sequential zeros and 6 sequential ones. Used to test 56 kb/s cir-
cuits with secondary channel to avoid the introduction of an all
zeros network byte.
X
QRSS
Modified 2
20
-1 pseudorandom pattern which allows a maximum
of 14 sequential zeros and 20 sequential ones. The QRSS pat-
tern simulates live data for T1 applications
X
R-TRIP-
DELAY
This pattern is used to measure full T1 delay by measuring the
amount of time required for a BERT pattern to traverse after
being transmitted towards a loop. Resolution and accuracy are
each measured in ms. Results for this feature are displayed as
“Delay ms” on the Signal screen. The DT1 and DTU cards sup-
port this feature. When this pattern is selected, the RTD results
will be valid.
X
X
X
X
User
<prog_pat>
Operator-programmable 3- to 24-bit test pattern. The
<prog_pat>
is entered as ones and zeros and transmitted from
left to right as entered. Enables patterns to be changed on a per-
test basis. Press
Enter
to set
<prog_pat>
to the system
default of 101.
X
X
X
User1
Number One 3- to 24-bit system-programmable test pattern. Pat-
tern transmits specific bit patterns to test circuit sensitivity to a
particular pattern. The pattern is entered in binary form through
the Supervisor Menu.
X
X
X
User2
Number Two 3- to 24-bit system-programmable test pattern. Pat-
tern transmits specific bit patterns to test circuit sensitivity to a
particular pattern. The pattern is entered in binary form through
the Supervisor Menu.
X
Userpat1
Supervisor-programmable 3- to 24-bit test pattern. The bit pat-
tern is entered as ones and zeros and transmitted from left to
right as entered. The bit pattern and pattern name are pro-
grammed from the Supervisor Menu. This is the default pattern
name and 1010 is the default test pattern. This allows the
CT-650 to transmit specific patterns to test circuit sensitivity.
Table 12
Digital test patterns (Continued)
DS3
DS1
FT1
DD
S
Pattern
Description
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Страница 104: ...Chapter 7 DS0 VF Test Commands Description of VF test commands 78 CT 650 Command Line Reference Guide Release 9 4 ...
Страница 108: ...Chapter 8 Batch Files Unavailable commands for batch files 82 CT 650 Command Line Reference Guide Release 9 4 ...
Страница 198: ...Appendix A Test Results Definitions Loopback status information 172 CT 650 Command Line Reference Guide Release 9 4 ...
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