Appendix C
Test Patterns and Loop Codes
Test patterns
196
CT-650 Command-Line Reference Guide
Release 9.4
X
X
Pat_Sensit
ive RDDS3
Single octet medium ones density test pattern which is used to
simulate a typical signal transmitted over a DDS circuit. RDDS3
is a continuous series of octets of 1100 0100 … (reverse of
DDS3).
X
X
Pat_Sensit
ive DDS4
Single octet low ones density test pattern. DDS4 is a continuous
series of octets of 0100 0000 ….
X
X
Pat_Sensit
ive DDS5
DDS1, DDS2, DDS3, and DDS 4 test pattern. DDS5 generates
each pattern in sequence.
X
X
Pat_Sensit
ive DDS6
Eight octet fixed test pattern which is used to simulate DDS sig-
nal transition form IDLE mode to DATA mode. It also aids in
detecting marginal equipment in multipoint applications. DDS6 is
a seven octet fixed pattern of 1111 1110 followed by one octet of
1111 1111.
X
X
X
PRBS 2^15-
1
32,767-bit pseudorandom pattern generates a maximum of 14
sequential zeros and 15 sequential ones. Pattern provides a
maximum number of zeros allowed for framed, non-B8ZS testing
and does not meet minimum ones density requirement.
X
X
X
PRBS 2^20-
1
1,048,575-bit pseudorandom pattern generates a maximum of
19 sequential zeros and 20 sequential ones. Pattern conforms
with Bell Compatibility Bulletin No. 114. Pattern exceeds excess
zeros and does not meet the minimum ones density require-
ments for T1/FT1 applications.
X
X
X
PRBS 2^23-
1
8,388,607-bit pseudorandom pattern generates a maximum of
22 sequential zeros and 23 sequential ones. Pattern exceeds
excess zeros and does not meet the minimum ones density
requirements for T1/FT1 applications.
X
X
X
PRBS 2047
2047-bit pseudorandom pattern generates a maximum of 10
sequential zeros and 11 sequential ones.
DDS Rate — Used to test DDS and other circuits operating
between 9.6 and 56 kb/s.
X
X
X
PRBS 511
511-bit pseudorandom pattern generates a maximum of 8
sequential zeros and 9 sequential ones. Used to test DDS and
other circuits operating below 9.6 kb/s.
Table 12
Digital test patterns (Continued)
DS3
DS1
FT1
DD
S
Pattern
Description
Содержание CT-650
Страница 1: ...CT 650 Wideband Test Unit Release 9 4 Command Line Reference Guide ...
Страница 2: ......
Страница 3: ...CT 650 Wideband Test Unit Release 9 4 Command Line Reference Guide ...
Страница 4: ......
Страница 22: ...Contents xxii CT 650 Command Line Reference Guide Release 9 4 ...
Страница 104: ...Chapter 7 DS0 VF Test Commands Description of VF test commands 78 CT 650 Command Line Reference Guide Release 9 4 ...
Страница 108: ...Chapter 8 Batch Files Unavailable commands for batch files 82 CT 650 Command Line Reference Guide Release 9 4 ...
Страница 198: ...Appendix A Test Results Definitions Loopback status information 172 CT 650 Command Line Reference Guide Release 9 4 ...
Страница 240: ...Appendix D Customer Services and Support Training options 214 CT 650 User s Guide Release 9 3 ...
Страница 247: ......