
preliminary
preliminary
iC-PVS
LINEAR/OFF-AXIS
BATTERY-BUFFERED ABSOLUTE POSITION HALL SENSOR
Rev A2, Page 8/51
ELECTRICAL CHARACTERISTICS
Operating conditions:
VDD = 3.15...5.5 V, VBAT = 3.0...5.0 V, GND = 0 V, Tj = -40...125
°
C, fslow calibrated to 34 kHz with IBIAS, unless otherwise stated.
Item
Symbol
Parameter
Conditions
Unit
No.
Min.
Typ.
Max.
General
001 V(VDD)
Permissible Main Supply Voltage VON5 = 0
3.15
3.3
5.5
V
VON5 = 1
4.50
5.0
5.5
V
002 I(VDD)
Supply Current in VDD
Tj = 27
°
C, no load,
VDD = 3.3 V
40
60
mA
VDD = 5.0 V
50
80
mA
003 SR(VDD)
Permissible Slew Rate at VDD
0.1
V/
µ
s
004 V(VBAT)
Permissible Battery Voltage
3.0
3.6
5.0
V
005 Iavg(VBAT) Average Supply Current in VBAT VBAT = 3.6 V, Tj = 27
°
C,
10
1500
µ
A
depending on fmag and A_MAX, see Table 44
006 Ipls(VBAT) Pulse Current in VBAT
pulsed operation, tpulse < 10
µ
s, Tj = 27
°
C,
8.0
20.0
mA
007 Vc()hi
Clamp Voltage hi at All Pins
except VDD
Vc()hi = V() - V(VDDS), I() = +1 mA
0.3
0.7
1.6
V
008 V()
Voltage at all other pins except
VDD, VBAT, VDDS and GND
general
-0.25
VDDS+0.3
V
V(VDD) > Von ( VDD supply )
-0.25
VDD+0.3
V
V(VDD) < Von ( Battery supply)
-0.25
VBAT+0.3
V
009 Vc()lo
Clamp Voltage lo at All Pins
except VDDS
I() = -1 mA
-1.6
-0.7
-0.25
V
010 C(VBAT)
External Bypass Capacitor
at Pin VBAT
ceramic capacitor placed as close as possible
to the pin
1
1
µ
F
011 C(VDDS)
External Bypass Capacitor
at Pin VDDS
ceramic capacitor placed as close as possible
to the pin
1
1
µ
F
012 C(VDD)
External Bypass Capacitor
at Pin VDD
ceramic capacitor placed as close as possible
to the pin
1
1
µ
F
013 tstup(VDD) Startup Time Analog Signal Path
after VDD Power Cycle, Standby
or Sleep
ENAC = 0
1
2
ms
ENAC = 1
3
6
ms
Magnetic Signal Conditioning
101 hpac
Sensor-to-Package-Surface
Distance
QFN38 5x7
0.4
mm
102 Hmax
Permissible Maximum Magnetic
Field Strength, see Figure 11
AC+DC Field at chip surface
DCCOMP = 0
-180
180
kA/m
DCCOMP = 1
-380
380
kA/m
103 Bmax
Permissible Maximum Magnetic
Flux Density, see Figure 11
AC+DC Field at chip surface in air
DCCOMP = 0
-225
225
mT
DCCOMP = 1
-475
475
mT
104 Hamp
Permissible Operating Magnetic
Field Amplitude, see Figure 11
at chip surface
DCCOMP = 0:
10
100
kA/m
DCCOMP = 1:
13
100
kA/m
105 Bamp
Permissible Operating Amplitude
of Magnetic Flux Density, see
Figure 11
at chip surface in air
DCCOMP = 0:
12.5
125
mT
DCCOMP = 1:
16.25
125
mT
106 fmag
Permissible Magnetic Input Fre-
quency
VDDS = 5.0 V, tested via electrical input
25
kHz
107 frot
Permissible Rotation of Pole
Wheel with
32 pole pairs
46000
rpm
64 pole pairs
23000
rpm
108 vmax
Permissible Movement Speed
(Linear)
1.0 mm pole width (2 mm magnetic period)
50
m/s
1.5 mm pole width (3 mm magnetic period)
75
m/s
109 Ht
No Magnet Detection Threshold
(Magnetic Field )
MAGTHR = 0x00
5.0
kA/m
MAGTHR = 0x01
2.5
kA/m
MAGTHR = 0x02
1.25
kA/m
MAGTHR = 0x03
10.0
kA/m
device is in NoMagnet working state if field
amplitude (at chip surface) is below this value