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Chapter 5, Advanced Operations
Increasing Measurement Throughput
3. Frequency Counter Gate Time
The frequency counter’s gate time specifies how long the RF or AF frequency
counter samples the signal before displaying the measured result. Short gate times
measure instantaneous frequency and long gate times measure average frequency.
The longer the gate time, the longer the measurement cycle. The proper gate time
is determined by the measurement requirements. Use the following commands to
set gate times:
For AF frequency measurements, set the AF Analyzer’s gate time with the
AF Cnt Gate
field, using the following command:
:AFAN:GTIM <value> MS
For RF frequency measurements, set the RF Analyzer’s gate time with the
RF Cnt Gate
field, using the following command:
:RFAN:GTIM <value> MS
4. Number of Active Measurements
The Test Set is capable of making many measurements simultaneously.
Measurements are either in the active state (ON) or in the inactive state (OFF).
When the Test Set receives a trigger event, all active measurements are triggered.
A measurement cycle is complete when all active measurements have obtained a
valid measurement result. To decrease the measurement cycle time, all unused
measurements should be set to the inactive state (turned OFF). Turning OFF
unused measurements will have the greatest impact on reading repetition rate. Use
the STATe command to turn OFF all unneeded measurements on the displayed
screen.
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Страница 17: ...Contents 17 3 HP IB Command Guidelines Sequential and Overlapped Commands 72 Guidelines for Operation 73 ...
Страница 24: ...Contents 24 9 Error Messages ...
Страница 25: ...Contents 25 Index 593 ...
Страница 26: ...Contents 26 ...
Страница 27: ...27 1 Using HP IB ...
Страница 58: ...58 Chapter 1 Using HP IB Remote Local Modes ...
Страница 59: ...59 2 Methods For Reading Measurement Results ...
Страница 71: ...71 3 HP IB Command Guidelines ...
Страница 94: ...94 Chapter 3 HP IB Command Guidelines Guidelines for Operation ...
Страница 95: ...95 4 HP IB Commands ...
Страница 100: ...100 Adjacent Channel Power ACP ...
Страница 150: ...150 Display DISPlay space TDMA test TESTs TFReq THLP TIBasic TMAKe TPARm TPRint TSEQn TSPec Returns current screen TX ...
Страница 173: ...173 System System SYSTem ERRor Returns integer value quoted string ...
Страница 236: ...236 Triggering Measurements ...
Страница 237: ...237 5 Advanced Operations ...
Страница 350: ...350 Chapter 6 Memory Cards Mass Storage Using Memory Cards Figure 20 Inserting a Memory Card ...
Страница 360: ...360 Chapter 6 Memory Cards Mass Storage Using External Disk Drives ...
Страница 361: ...361 7 IBASIC Controller ...
Страница 442: ...442 Chapter 7 IBASIC Controller The TESTS Subsystem ...
Страница 559: ...559 Chapter 8 Programming The Call Processing Subsystem Example Programs 11280 SUBEND 11290 ...
Страница 562: ...562 Chapter 8 Programming The Call Processing Subsystem Example Programs ...
Страница 563: ...563 9 Error Messages ...
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