
C
Relative
intensity
noise
(RIN):
The
square
of
the
RMS
optical
power
amplitude
divided
by
the
measurement
bandwidth
and
the
square
of
the
average
optical
power
,
expressed
in
dB/Hz.
Conditions:
coherence
control
o,
temperature
within
operating
temperature
range
,
frequency
range
0.1
to
6
GHz.
Measurement
with
HP
lightwave
signal
analyzer
.
Relative
wavelength
accuracy:
When
randomly
changing
the
wavelength
and
measuring
the
dierences
between
the
actual
and
displayed
wavelengths
,
the
relative
wavelength
accuracy
is
6
half
the
span
between
the
maximum
and
the
minimum
value
of
all
dierences
.
Conditions:
uninterrupted
TLS
line
voltage
,
constant
power
level,
temperature
within
operating
temperature
range
,
coherence
control
o.
Measurement
with
wavelength
meter
.
Sidemode
suppression
ratio:
The
ratio
of
average
signal
power
to
the
optical
power
of
the
highest
sidemode
within
a
distance
from
0.1
to
6
GHz
to
the
signal's
optical
frequency
,
expressed
in
dB
.
Conditions:
at
a
specied
output
power
and
wavelength
range
,
temperature
within
operating
temperature
range
,
coherence
control
o.
Measurement
with
HP
lightwave
signal
analyzer
using
heterodyning
method.
Source
spontaneous
emission:
The
ratio
of
spontaneous
emission
power
in
0.1
nm
bandwidth
to
signal
power
within
a
62
nm
window
around
the
signal
wavelength,
at
!
maximum
specied
output
power
,
expressed
in
dB
per
0.1
nm.
Conditions:
at
maximum
specied
output
power
,
temperature
within
operating
temperature
range
,
coherence
control
o.
Measurement
with
optical
spectrum
analyzer
at
0.1
nm
resolution
bandwidth.
W
avelength
range:
The
range
of
wavelengths
for
which
the
specications
apply
.
W
avelength
repeatability:
The
uncertainty
in
reproducing
the
wavelength
after
detuning
and
re-setting
the
wavelength.
The
wavelength
repeatability
is
6
half
the
span
between
the
maximum
and
the
minimum
value
of
all
changes
.
Conditions:
uninterrupted
TLS
line
voltage
,
constant
power
level,
temperature
within
operating
temperature
range
,
coherence
control
o.
Measurement
with
wavelength
meter
.
W
avelength
resolution:
The
smallest
possible
displayed
wavelength
increment
/
decrement.
W
avelength
stability:
The
change
of
wavelength
during
a
given
time
span,
expressed
as
6
half
the
span
between
the
maximum
and
the
minimum
wavelengths
.
Conditions:
uninterrupted
TLS
line
voltage
,
constant
wavelength-
and
power
level
settings
,
coherence
control
o,
temperature
within
61
K,
time
span
as
specied.
Measurement
with
wavelength
meter
Specications
C-3
Содержание 8167A
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Страница 164: ...D Figure D 1 Test Setup for the Wavelength Tests D 4 Performance Tests ...
Страница 168: ...D Figure D 2 Test Setup for the Maximum Output Power Test except HP 8168F D 8 Performance Tests ...
Страница 177: ...D Figure D 5 Test Setup for the Source Spontaneous Emission Test Performance Tests D 17 ...
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