HP 54620A, Руководство пользователя и сервисное руководство

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delayed sweep window
edges used for measurement, 93
indicator for, 81
Time/div setting for, 81
delayed window
limited to data in main display, 86
delta t indicators, 95
design of probe tip, 140
design test ports, 142
device specifications
measuring hold time, 102–103
measuring setup time, 100–101
difference between trigger mode and
trigger type, 71
digital multimeter
See multimeter
disassembly, 181
display, 38
adjusting brightness of, 29
adjusting pattern, 163
adjustment, 162–163
and Autostore, 58
and labels, 59
and trigger, 70, 131
erasing, 58
glitches, 143–148
main and delayed sweep displays, 82
of acquired data, 46
of waveform, 55
overhead affects trigger output rate, 107
removing, 185
replacing assembly, 166
self-test, 162–163
setting up delayed sweep, 82
to adjust, 163
turning labels on or off, 59–61
waveform, 40
display flashing, 39
Display softkey
in self-test menus, 162
display system
performance characteristics, 202
divider probe
used to reduce signal swing, 109
divider probe application
large-scale signal to ext. trigger input, 109
divisions on graticule, 87
dual-channel measurements, 98–99
channel-to-channel delay, 92
hold time, 92
setup time, 92
where displayed, 41
dummy load, 155
making, 158
duplicate labels, 63
duration
and advanced trigger, 67
message, 210
duration operators
for advanced trigger, 76
duration trigger, 74–79
affected by timebase, 129–138
dust cover, 24–26
duty cycle
calculated, 97
measurement, 91
E
ECL threshold, 53–54
Edge, 47, 72
edge and pattern triggers combined, 76
edge qualifier in pattern trigger, 73
edge trigger, 47, 65, 72
applications of, 65
qualifying a pattern, 66
using external trigger input, 109
edges
defining for trigger, 74
of waveform disjointed, 146
set in channel measurements, 98
used to satisfy measurement criteria, 93
EMI performance characteristics, 204–206
end channel, 98–99
and edge, 92
entered (pattern trigger), 66
Entry knob, 37, 73
choosing edge trigger channel, 47, 72
choosing labels from list, 60–61
environmental characteristics, 204–206
equation
for voltage behavior, 141
equipment
for servicing analyzer, 164
for testing threshold accuracy, 169
for testing time interval accuracy, 173
set up to test threshold accuracy, 170
Erase, 58
labels, 64
measurement field, 91
trace memory, 112
error messages, 208
where displayed, 41
errors in operation
See solving problems
events
and pattern trigger, 66
capturing single-shot, 56
examine captured data using delayed
sweep, 80
exchange program, 190
exploded view, 192
extending trigger capabilities, 104
external trigger
connections, 106
signal margin, 109
external trigger input, 104
BNC, 108–109
logic threshold setting, 106
testing threshold accuracy, 169
used as edge trigger, 109
external trigger signal
available in all trigger types, 104
F
factory-default settings, 44–45
failing self-tests
acquisition system, 154
keyboard, 153–154
ROM and RAM, 152
fan
disconnecting cable, 167
remove to remove power supply, 187
removing, 183
flashing
of indicators on display, 39
forced trigger, 70, 131
frequency measurement, 91
using delayed sweep window, 93
Index
228