HP 54620A, Руководство пользователя и сервисное руководство

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circuit ground
connecting to analyzer, 42–43
circuit signals
associating with channel, 40
associating with input channels, 59
circuit under test
action to cause trigger, 71, 132
concepts of probing, 139–142
circuitry
glitch capture, 143–148
clear
cursors, 91, 94–95
measurement, 97
measurement field, 91
previously saved trace, 116
trace memory, 112
clearing labels, 64
clock channel, 100, 102
in hold time measurement, 103
in setup time measurement, 101
threshold accuracy, 169
clock edge
select for delay measurements, 98
CMOS threshold, 53–54
color of keys and relationship to function,
37
color palettes, 30, 41
channel colors, 40
colors in waveform display, 40
selecting, 31–32
colors
assigning to channels, 33
selecting palettes, 31–32
comparators
input, 54
comparing measurement results, 111
components
See replaceable parts
concepts
aliasing and glitch capture, 144
choosing timebase to capture glitch, 145
delayed sweep, 133
glitch detection, 143–148
imput impedance, 139–142
making accurate measurements, 128
memory bar, 132
probe grounding, 140
probing circuit under test, 139–142
probing practices, 142
storage of samples, 130
time reference, 133
timebase and acquisition, 129–138
trigger functions, 132
trigger modes, 131
configuration
default, 44–45
preset default settings, 119
recalling, 118
saved in memory, 117
saving and recalling, 111–112
using Autoscale, 44–45
connecting
grabbers, 42–43
power cord, 27
to circuit ground, 42–43
to function generator, 171, 174
to pulse generator, 174
connecting to circuit ground, 42
connections
external trigger from scope, 106
external trigger using scope probe, 106
for trigger oscilloscope, 107
contents of analyzer package, 22–23
controls
front panel, 35–36
knobs, 37
covers
remove for service, 164
creating labels, 62–63
CRT, hazardous voltages, 181
cursors
activated by analyzer, 97
clearing, 91, 94–95
message, 211
moving simultaneously, 94–95
preset configuration, 119
readouts, 91, 94–95
use on irregular patterns, 97
use to measure waveform data, 89
use to test time interval accuracy, 176
used to measure period, 91
custom labels, 60–63
D
damage to analyzer
power down before servicing, 164
damaged shipment, 22–26
data
measuring, 89
data acquisition
See acquisition
data captured
acquired by sampling, 129–138
examine with delayed sweep, 80
in time interval accuracy test, 177
to fill main display, 86
data channel, 100, 102
in hold time measurement, 103
in setup time measurement, 101
threshold accuracy, 169
data entry field, 37
Default color palette, 30
default configuration, 44–45
default setup, 113, 119
defective assemblies, 190
defining edge trigger, 74
defining labels, 62–63
defining sources, 74
delay, 39
adjusting, 93
and trigger event position, 70–71
channel-to-channel, 98–99
introduced by timebase, 138
measured on dual channels, 92
message, 210
setting, 37
delay indicator
for trigger position, 84
Delay knob, 37
used to pan display, 86
delay setting concepts, 133
delay time defined, 98
delay value displayed, 84
delayed sweep
changing main sweep Time/div, 82
concepts, 133
magnifies contents of sample memory, 80
setting up display, 82
shows glitch, 146
Time/div setting for, 82
Index
227