Rev. 1.00
22
September 11, 2018
Rev. 1.00
23
September 11, 2018
HT45F4050
A/D NFC Flash MCU
HT45F4050
A/D NFC Flash MCU
Symbol
Parameter
Test Conditions
Min.
Typ. Max. Unit
V
DD
Conditions
V
OR
PGA Maximum Output
Voltage Range
2.2V
—
V
SS
+0.1 — V
DD
-0.1
V
3V
V
SS
+0.1 — V
DD
-0.1
5V
V
SS
+0.1 — V
DD
-0.1
V
VR
Fix Voltage Output of PGA
2.2V~
5.5V
Ta=-40°C~85°C,
V
RI
=V
BGREF
(PGAIS=1)
-1%
2
+1%
V
3.2V~
5.5V
Ta=-40°C~85°C,
V
RI
=V
BGREF
(PGAIS=1)
-1%
3
+1%
4.2V~
5.5V
Ta=-40°C~85°C,
V
RI
=V
BGREF
(PGAIS=1)
-1%
4
+1%
Internal Reference Voltage Electrical Characteristics
Ta=-40°C~85°C, unless otherwise specified
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
V
DD
Conditions
V
DD
Operating Voltage
—
—
2.2
—
5.5
V
V
BGREF
Bandgap Reference Voltage
—
Ta=-40°C~85°C
-2%
1.2
+2%
V
I
BGREF
Operating Current
5.5V
Ta=-40°C~85°C
—
25
40
μA
PSRR
Power Supply Rejection Ratio
—
V
RIPPLE
=1V
P-P
,
f
RIPPLE
=100Hz
75
—
—
dB
En
Output Noise
—
no load current,
f=0.1Hz ~ 10Hz
—
300
—
μV
RMS
I
SD
Shutdown Current
—
VBGREN=0
—
—
0.1
μA
t
START
Startup Time
2.2V~5.5V
—
—
—
400
μs
Note: 1. All the above parameters are measured
under conditions of no load condition unless otherwise decribed.
2. A 0.1μF ceramic capacitor should be connected between VDD and GND.
3. The V
BGREF
voltage is used as the A/D converter PGA input.