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MPC563
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nce
Man
u
al, Re
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. 1
Preliminar
y—Subject to
Chang
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Without Notice
917
23.4.10 Test and Development Support
23.4.10.1 Overview
Following sections describe several features available to support development and test. Most debug features, described in
Section 23.4.10.2, “Development Support Features
,” are accessible through a separate debug bus, and are not available through
registers in the standard eTPU memory map. The details of the access to this interface are MCU-dependent, but a separate IP block,
called NDEDI, is provided so that these features are accessible by a Nexus interface. IP-bus Green line SoC debug request can also
be used to put microengines in halt state. Conditions for the assertion of this line are also MCU-dependent.
Section 23.4.10.3, “Test Support Features
” describe embedded test features: the Multiple Input Signature Calculator - MISC - is an
SCM test feature accessible through registers ETPUMCR and ETPUMISCCMPR (see
Section 23.3.2, “System Configuration
). MISC allows SCM test “on the fly”, i.e., while eTPU is running, with no impact on eTPU functionality or performance.
23.4.10.2 Development Support Features
23.4.10.2.1
Internal Debug Interface and Nexus Class 3 Support
eTPU provides an Internal Debug Interface that exports real-time microengine states and values, including breakpoint/watchpoint
information. It also provides inputs for breakpoint request from other blocks or outside MCU. Internal Debug Interface is fully
specified in the
eTPU Integration Guide
.
E1
1 1 1
BCC[5]
J/C
BCC[4:0]
FLS
R
W
BCF
BAF[13:0]
00
P/D
STC
E2
01
AID[2:0]
E3
FL
10
rsv
SMPR
E4
0
11
1
rsv
F1
rsv
1
rsv
111
rsv
format
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
16
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
ALU Operations
Channel Control/Config Operations
RAM Operations
Flow Control Operations
Table 23-99. Microinstruction Formats (continued)
format
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30
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25
24
23
22
21
20
19
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17
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15
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13
12
11
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9
8
7
6
5
4
3
2
1
0
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